[PDF] Top 20 C107 2004 5 ETS 最近の更新履歴 Hideo Fujiwara

... First, we evaluate the test generation results. In this ex- periment, our method was performed as follows. Column “#Arcs” in Table 3 corresponds to the number of constraints in Step 1 of our method. We used all the ... 完全なドキュメントを参照

... Osaka, JAPAN fujiwara@ogu.ac.jp Abstract— A binding method for hierarchical testability has been proposed to increase the number of testable operational units in hierarchical testing using behavioral level ... 完全なドキュメントを参照

... 5. Conclusion τ k notation has been introduced in order to clarify the test generation complexity. Based on this notation, the test generation complexity for balanced sequential circuits, strongly balanced ... 完全なドキュメントを参照

... Obviously, the best sensitivity, i.e. lowest value of R i before a delay fault of 10% is observed, will be for i=1; which is closest to the input (or stem). For the 2-branch and 3-branch test paths (Figure 4b, ... 完全なドキュメントを参照

... While drastically reducing the test volume and the test application time, test response compactors lose the lo- cation of errors in the scan chains, which is necessary for diagnosis.. Th[r] ... 完全なドキュメントを参照

... At present, multiple scan chain design is often used to reduce the scan test shift time. This technique consists of splitting the scan chain in small scan sub-chains activated at the same time. The size of the different ... 完全なドキュメントを参照

... 5. Experimental Results We have conducted experiments on the data paths of LWF, Paulin, Tseng, and JWF. Table 1 shows the characteristics of these data paths. Columns #PI, #PO, #Reg, #MUX, #M, denote the number of ... 完全なドキュメントを参照

... Recent works link tests for modules inside proces- sors with test programs to achieve high fault efficiency for structural fault models. Krantis et al.[5] propose ef- ficient deterministic approach for modules with ... 完全なドキュメントを参照

... Keywords: ATPG, scan and non-scan, fault efficiency 1. Introduction Both full [5] and partial [1] scan techniques fail to pro- vide at speed testing. Though partial scan offers lower overhead than full scan, it ... 完全なドキュメントを参照

... flip-flops into scan-chains has to be rounded upwards since the length of a scan-chain must be an integer. For each core, a set of test vectors is given and for a given TAM bandwidth, we can compute its test time using ... 完全なドキュメントを参照

... (4) The quality of the solution Table 6 shows the test application time, which is cal- culated in cases 1 to 3, and the lower bounds of optimum solution, which is denoted in Sect. 4. The 1st column shows the case number. ... 完全なドキュメントを参照

... Li: Huahong Co. Group is the largest national ASIC design and manufacture group in China. Huahong Group incorporated specifically to undertake the “909” project, the most important microelectronic project of China’s ... 完全なドキュメントを参照

... 1. Introduction Test generation for a sequential circuit is, in general a hard problem and may be unsolvable in reasonable amount of time for a large circuit [1],[2]. If a test generation problem of a sequential circuit ... 完全なドキュメントを参照

... In [2,3] the effects of an imperfect tester on the resulting yield during a delay (AC) test is discussed. In [4,5] a more generalized fault probability model is introduced to enhance the defect vs. yield equation. ... 完全なドキュメントを参照

... Applying our template generation, 276 templates were generated automatically to detect stuck-at faults in ALU, and 216 templates of them were discarded because they had the same constraints as some templates which had ... 完全なドキュメントを参照

... 5.3 マイクロプログラム制御 いくつかの制御信号を１語にまとめたのを制御語 一連の制御語をROMやRAM（PLAも可能）などのメモリに格納しておき それを順次取り出すことにより制御信号列を生成する制御方法を ... 完全なドキュメントを参照

... B. Wrapper Configuration with Rectangle Transformation Core wrapper scan architecture is configured to minimize the test time by constructing wrapper scan chains in a way that their length are well balanced as the longest ... 完全なドキュメントを参照

... 2010 年 (64 歳 ) The Last Byte R.Aitken@IEEE_Design&Test ITC’99 ベンチマーク ITC’99@Atlantic City, NJ この The Last Byte の編集者は Scott Davidson で、私に、このコ ラムを書くように依頼した。  ... 完全なドキュメントを参照

... 7,5 THE MODElS AT WORK: COMPARATiVE STATICS What is the use of solving models and deriving equilibria? Models are simpliied de­ scriptions of reality, a way of understanding a particular situation. Once we ... 完全なドキュメントを参照

... I 3 : SUB R5, R6, R7 -- processor schedules this instr. to ALU1 I 4 : SUB R25, R6, R7 -- processor schedules this instr. to ALU2 This can apply the test sequence to both the ALUs provided that these instructions ... 完全なドキュメントを参照