第 8 章 CdTe ピクセル検出器を使った観測への 応用応用
A.4 結果
このCdTeピクセル検出器の動作試験は、ボン大学でおこなわれている。最初の試験には、我々 も実際に立ち会い、共同でおこなった。この最初の試験で、ガンマ線イベントの検出に成功して いる。その後、詳細な性能評価は、ボン大学が進めている。
共通電極に+40Vのバイアス電圧をかけて、241Amからのガンマ線を照射した時のイメージを 図A.4に示す。図A.4(a)では3mmのナットを、図A.4(b)では、はんだをMの形にしたものを
A.4. 結果 109
図A.3: MPECチップ上に形成されたスタッドバンプ
上に置いている。バンプの間隔は70-330µs であったが、95.5%のバンプで接合に成功していた。
(a) (b)
図 A.4: MPECチップによるCdTeピクセル検出器で取得したガンマ線のイメージ
このような200µm角という微細なピクセルの個々に、CSAとフォトンカウンティングの回路を 接合したイメージング検出器はこれまでになく、世界にさきがげたものである。
111
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