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MOSFET – Power, N-Channel, SUPERFET III, Easy Drive

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SUPERFET III, Easy Drive

650 V, 30 A, 99 mW

FCMT099N65S3

Description

SUPERFET III MOSFET is ON Semiconductor’s brand−new high voltage super−junction (SJ) MOSFET family that is utilizing charge balance technology for outstanding low on−resistance and lower gate charge performance. This advanced technology is tailored to minimize conduction loss, provide superior switching performance, and withstand extreme dv/dt rate. Consequently, SUPERFET III MOSFET is very suitable for the switching power applications such as server / telecom power, adaptor and solar inverter applications.

The Power88 package is an ultra−slim surface−mount package (1 mm high) with a low profile and small footprint (8x8 mm

2

).

SUPERFET III MOSFET in a Power88 package offers excellent switching performance due to lower parasitic source inductance and separated power and drive sources. Power88 offers Moisture Sensitivity Level 1 (MSL 1).

Features

700 V @ T

J

= 150 ° C

Typ. R

DS(on)

= 87 m W

• Ultra Low Gate Charge (Typ. Q

g

= 56 nC)

• Low Effective Output Capacitance (Typ. C

oss(eff.)

= 500 pF)

• 100% Avalanche Tested

• These Devices are Pb−Free and are RoHS Compliant

Applications

• Telecom / Server Power Supplies

• Industrial Power Supplies

• UPS / Solar

www.onsemi.com

See detailed ordering and shipping information on page 2 of this data sheet.

ORDERING INFORMATION

$Y = ON Semiconductor Logo

&Z = Assembly Plant Code

&3 = Data Code (Year & Week)

&K = Lot Code

FCMT099N65S3 = Specific Device Code MARKING DIAGRAM

D

S2 G

POWER MOSFET

VDSS RDS(ON) MAX ID MAX

650 V 99 mW @ 10 V 30 A

S1

S1: Driver Source S2: Power Source

S2S2 S1G PQFN4 8X8 2P

CASE 483AP

$Y&Z&3&K FCMT 099N65S3

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ABSOLUTE MAXIMUM RATINGS (TC = 25°C, Unless otherwise specified)

Symbol Parameter Value Unit

VDSS Drain to Source Voltage 650 V

VGSS Gate to Source Voltage DC ±30 V

AC (f > 1 Hz) ±30 V

ID Drain Current Continuous (TC = 25°C) 30 A

Continuous (TC = 100°C) 19

IDM Drain Current Pulsed (Note 1) 75 A

EAS Single Pulsed Avalanche Energy (Note 2) 145 mJ

IAS Avalanche Current (Note 1) 4.4 A

EAR Repetitive Avalanche Energy (Note 1) 2.27 mJ

dv/dt MOSFET dv/dt 100 V/ns

Peak Diode Recovery dv/dt (Note 3) 20

PD Power Dissipation (TC = 25°C) 227 W

Derate Above 25°C 1.82 W/°C

TJ, TSTG Operating and Storage Temperature Range −55 to +150 °C

TL Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 s 300 °C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.

1. Repetitive rating: pulse-width limited by maximum junction temperature.

2. IAS = 4.4 A, RG = 25W, starting TJ = 25°C.

3. ISD ≤ 15 A, di/dt ≤ 200 A/ms, VDD ≤ 400 V, starting TJ = 25°C.

THERMAL CHARACTERISTICS

Symbol Parameter Value Unit

RqJC Thermal Resistance, Junction to Case, Max. 0.55 _C/W

RqJA Thermal Resistance, Junction to Ambient, Max. (Note 4) 45

4. Device on 1 in2 pad 2 oz copper pad on 1.5 x 1.5 in. board of FR−4 material.

PACKAGE MARKING AND ORDERING INFORMATION

Part Number Top Marking Package Reel Size Tape Width Shipping

FCMT099N65S3 FCMT099N65S3 PQFN8 13” 13.3 mm 3000 / Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.

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ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)

Symbol Parameter Test Conditions Min Typ Max Unit

OFF CHARACTERISTICS

BVDSS Drain to Source Breakdown Voltage VGS= 0 V, ID= 1 mA, TJ= 25_C 650 V

VGS= 0 V, ID= 1 mA, TJ= 150_C 700 V

DBVDSS/DTJ Breakdown Voltage Temperature

Coefficient ID= 1 mA, Referenced to 25_C 0.68 V/_C

IDSS Zero Gate Voltage Drain Current VDS= 650 V, VGS= 0 V 10 mA

VDS= 520 V, TC= 125_C 2.77

IGSS Gate to Body Leakage Current VGS=±30 V, VDS= 0 V ±100 nA

ON CHARACTERISTICS

VGS(th) Gate Threshold Voltage VGS= VDS, ID= 0.7 mA 2.5 4.5 V

RDS(on) Static Drain to Source On Resistance VGS= 10 V, ID= 15 A 87 99 mW

gFS Forward Transconductance VDS= 20 V, ID= 15 A 17 S

DYNAMIC CHARACTERISTICS

Ciss Input Capacitance VDS= 400 V, VGS= 0 V, f = 1 MHz 2270 pF

Coss Output Capacitance 50 pF

Coss(eff.) Effective Output Capacitance VDS= 0 V to 400 V, VGS= 0 V 500 pF Coss(er.) Energy Related Output Capacitance VDS= 0 V to 400 V, VGS= 0 V 74 pF

Qg(tot) Total Gate Charge at 10 V VDS= 400 V, ID= 15 A, VGS= 10 V

(Note 5) 56 nC

Qgs Gate to Source Gate Charge 13 nC

Qgd Gate to Drain “Miller” Charge 23 nC

ESR Equivalent Series Resistance f = 1 MHz 0.5 W

SWITCHING CHARACTERISTICS

td(on) Turn-On Delay Time VDD= 400 V, ID= 15 A, VGS= 10 V, Rg= 4.7W (Note 5)

22 ns

tr Turn-On Rise Time 20 ns

td(off) Turn-Off Delay Time 58 ns

tf Turn-Off Fall Time 5 ns

SOURCE-DRAIN DIODE CHARACTERISTICS

IS Maximum Continuous Source to Drain Diode Forward Current 30 A

ISM Maximum Pulsed Source to Drain Diode Forward Current 75 A

VSD Source to Drain Diode Forward Voltage VGS= 0 V, ISD= 15 A 1.2 V

trr Reverse Recovery Time VDD= 400 V, ISD= 15 A, dIF/

dt = 100 A/ms 352 ns

Qrr Reverse Recovery Charge 6.5 mC

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.

5. Essentially independent of operating temperature typical characteristics.

(4)

TYPICAL PERFORMANCE CHARACTERISTICS

6 8

10 ID = 15 A

VDS = 130 V

VDS = 400 V 100

1000 10000 100000

C Ciss

0.001 0.01 0.1 1 10

100 VGS = 0 V 250 ms Pulse Test

25°C 150°C

−55°C

0.0 0.1 0.2 0.3

0.4 TC = 25°C

VGS = 10 V

VGS = 20 V

1 10

80 VDS = 20 V 250 ms Pulse Test

25°C

−55°C 150°C

0.1 1 10 80

250 ms Pulse Test TC = 25°C

VGS, Gate−Source Voltage (V)6 ID, Drain Current (A)

3

0

ID, Drain Current (A) RDS(ON), Drain−Source On−Resistance (W)

80 VSD, Body Diode Forward Voltage (V)

IS, Reverse Drain Current (A)oltage (V)

Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics VDS, Drain−Source Voltage (V)

ID, Drain Current (A)

Figure 3. On−Resistance Variation vs.

Drain Current and Gate Voltage

Figure 4. Body Diode Forward Voltage Variation vs. Source Current and

Temperature 40

20 60

0.1 1 10 20 4 5 7

0.0 0.5 1.0 1.5

8 9

2 VGS = 10.0 V

8.0 V 7.0 V 6.5 V 6.0 V 5.5 V

(5)

TYPICAL PERFORMANCE CHARACTERISTICS

(Continued)

5 10 15

0 10 20 30

0.1 1 10 100

0.01

TC = 25°C TJ = 150°C Single Pulse Operation in this Area is Limited by RDS(on)

DC

100 ms 1 ms

10 ms

10 ms

0.0 0.5 1.0 1.5 2.0 2.5

3.0 VGS = 10 V ID = 15 A

0.8 0.9 1.0 1.1

1.2 VGS = 0 V ID = 10 mA

EOSS, (mJ)

1 10 100 1000 25

VDS, Drain−Source Voltage (V) ID, Drain Current (A)

TC, Case Temperature (5C) ID, Drain Current (A)

50 75 100 125 150

−50

Figure 7. Breakdown Voltage Variation vs. Temperature

Figure 8. On−Resistance Variation vs. Temperature

TJ, Junction Temperature (5C) BVDSS, Drain−Source Breakdown Voltage (Normalized)

0 50 100 150

TJ, Junction Temperature (5C) RDS(on), Drain−Source On−Resistance (Normalized)

−50 0 50 100 150

Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature

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TYPICAL PERFORMANCE CHARACTERISTICS

(Continued)

ZqJC(t) = r(t) x RqJC RqJC = 0.55°C/W

Peak TJ = PDM x ZqJC(t) + TC Duty Cycle, D = t1 / t2 D = 0.5

0.20.1 0.05 0.02 0.01

DUTY CYCLE − DESCENDING ORDER

SINGLE PULSE

PDM

t1 t2

t, Rectangular Pulse Duration (sec) r(t), Normalized Effective Transient Thermal Resistance

Figure 12. Transient Thermal Response Curve

10−5 10−4 10−3 10−2 10−1 100

0.001 0.01 0.1 1 2

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Figure 13. Gate Charge Test Circuit & Waveform

Figure 14. Resistive Switching Test Circuit & Waveforms

Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms RL

VDS VGS

VGS

RG

DUT

VDD

VDS

VGS10%

90%

10%

90% 90%

ton toff

tr tf

td(on) td(off)

Qg

Qgd Qgs

VGS

Charge VDS

VGS

RL

DUT IG = Const.

VDD VDS

RG VGS DUT

L

ID

tp

VDD

tp Time

IAS

BVDSS

ID(t)

VDS(t) EAS+1

2@LIAS2

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Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT

L

VDD

RG

ISD

VDS +

VGS

Same Type as DUT

− dv/dt controlled by RG

− ISD controlled by pulse period Driver

VGS (Driver)

ISD

(DUT)

VDS

(DUT) VSD

IRM

10 V

di/dt

VDD IFM, Body Diode Forward Current

Body Diode Reverse Current

Body Diode Recovery dv/dt

Body Diode Forward Voltage Drop D+ Gate Pulse Width

Gate Pulse Period

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PQFN4 8X8, 2P CASE 483AP

ISSUE A

DATE 06 JUL 2021

98AON13664G

DOCUMENT NUMBER: Electronic versions are uncontrolled except when accessed directly from the Document Repository.

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参照

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