MOSFET – Power, Single N-Channel
40 V, 0.42 m W , 554.5 A
Features
• Small Footprint (8x8 mm) for Compact Design
• Low R
DS(on)to Minimize Conduction Losses
• Low Q
Gand Capacitance to Minimize Driver Losses
• Wettable Flank Plated for Enhanced Optical Inspection
• AEC−101 Qualified and PPAP Capable
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Parameter Symbol Value Unit
Drain−to−Source Voltage VDSS 40 V
Gate−to−Source Voltage VGS ±20 V
Continuous Drain
Current RqJC (Note 2) Steady
State TC = 25°C ID 554.5 A TC = 100°C 392.1 Power Dissipation
RqJC (Note 2) Steady
State TC = 25°C PD 245.4 W
TC = 100°C 122.7
Continuous Drain Current RqJA (Notes 1, 2)
Steady
State TA = 25°C ID 78.9 A
TA = 100°C 55.8
Power Dissipation
RqJA (Notes 1, 2) Steady
State TA = 25°C PD 5.0 W
TA = 100°C 2.5
Pulsed Drain Current TA = 25°C, tp = 10 ms IDM 900 A Operating Junction and Storage Temperature
Range TJ, Tstg −55 to
+175 °C
Source Current (Body Diode) IS 204.5 A
Single Pulse Drain−to−Source Avalanche
Energy (IL(pk) = 52.7 A) EAS 2058 mJ
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s) TL 260 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
THERMAL RESISTANCE MAXIMUM RATINGS
Parameter Symbol Value Unit
Junction−to−Case − Steady State (Note 2) RqJC 0.61 °C/W Junction−to−Ambient − Steady State (Note 2) RqJA 30.2 1. Surface−mounted on FR4 board using a 1 in2 pad size, 1 oz. Cu pad.
2. The entire application environment impacts the thermal resistance values shown, they are not constants and are only valid for the particular conditions noted.
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ORDERING INFORMATION V(BR)DSS RDS(ON) MAX ID MAX
40 V 0.42 mW @ 10 V
554.5 A 0.66 mW @ 4.5 V
G (1)
S (2−4) N−CHANNEL MOSFET
D (5−8)
POWER 88 CASE 507AP MARKING DIAGRAM
XXXXXXXX AWLYWW
XXX = Device Code (8 A−N characters max) A = Assembly Location WL = 2−digit Wafer Lot Code Y = Year Code
WW = Work Week Code
Parameter Symbol Test Condition Min Typ Max Unit OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 mA 40 V
Drain−to−Source Breakdown Voltage
Temperature Coefficient V(BR)DSS/
TJ ID = 250 mA, ref to 25°C 12.6 mV/°C
Zero Gate Voltage Drain Current IDSS VGS = 0 V,
VDS = 40 V TJ = 25°C 10
TJ = 125°C 250 mA
Gate−to−Source Leakage Current IGSS VDS = 0 V, VGS = 20 V 100 nA
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage VGS(TH) VGS = VDS, ID = 250 mA 1.2 2.0 V
Negative Threshold Temperature Coefficient VGS(TH)/TJ ID = 250 mA, ref to 25°C −6.0 mV/°C Drain−to−Source On Resistance RDS(on) VGS = 10 V ID = 50 A 0.35 0.42
VGS = 4.5 V ID = 50 A 0.52 0.66 mW
Forward Transconductance gFS VDS =5 V, ID = 50 A 323 S
Gate Resistance RG TA = 25°C 1.0 W
CHARGES, CAPACITANCES & GATE RESISTANCE
Input Capacitance CISS
VGS = 0 V, f = 1 MHz, VDS = 20 V
16013
Output Capacitance COSS 6801 pF
Reverse Transfer Capacitance CRSS 299
Total Gate Charge QG(TOT)
VGS = 4.5 V, VDS = 20 V; ID = 50 A
126
Threshold Gate Charge QG(TH) 22.5 nC
Gate−to−Source Charge QGS 39.9
Gate−to−Drain Charge QGD 38.4
Total Gate Charge QG(TOT) VGS = 10 V, VDS = 20 V; ID = 50 A 265 nC
SWITCHING CHARACTERISTICS, VGS = 4.5 V (Note 4)
Turn−On Delay Time td(ON)
VGS = 4.5 V, VDS = 20 V, ID = 50 A, RG = 6 W
89.4
Rise Time tr 111 ns
Turn−Off Delay Time td(OFF) 180
Fall Time tf 84.7
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage VSD VGS = 0 V,
IS = 50 A
TJ = 25°C 0.75 1.2
TJ = 125°C 0.6 V
Reverse Recovery Time tRR
VGS = 0 V, dIS/dt = 100 A/ms, IS = 50 A
99.3
Charge Time ta 62.4 ns
Discharge Time tb 36.9
Reverse Recovery Charge QRR 228 nC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.
3. Pulse Test: pulse width v 300 ms, duty cycle v 2%.
4. Switching characteristics are independent of operating junction temperatures.
TYPICAL CHARACTERISTICS
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On−Resistance vs. Gate−to−Source Voltage
Figure 4. On−Resistance vs. Drain Current and Gate Voltage
VGS, GATE−TO−SOURCE VOLTAGE (V) ID, DRAIN CURRENT (A)
9 8 7 0 6
260 110
10
Figure 5. On−Resistance Variation with Temperature
Figure 6. Drain−to−Source Leakage Current vs. Voltage
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (V) 145
105 65
−15 0−55 2.0
40 35 30 25 10
RDS(on), DRAIN−TO−SOURCE RESISTANCE (mW) RDS(on), DRAIN−TO−SOURCE RESISTANCE (mW)
RDS(on), NORMALIZED DRAIN−TO− SOURCE RESISTANCE IDSS, LEAKAGE CURRENT (nA)
TJ = 25°C ID = 50 A
VGS = 10 V
VGS = 10 V ID = 50 A
25
TJ = 85°C 12
4
5 15
TJ = 25°C 1E+06
1.0 2 8
210 0.6
1.0 1.4
5 6
10
0.2 0.4 0.8 1.2 1.6 1.8
10
TJ = 150°C TJ = 125°C
1E+03 1E+02 1E+01 1E+00 0 0.2 0.4 0.8 1.2
TJ = 25°C
1
20 1E+04
1E+05
60 160
0.6 1.4
VGS = 4.5 V
4 3 2
VDS, DRAIN−TO−SOURCE VOLTAGE (V) VGS, GATE−TO−SOURCE VOLTAGE (V) 0 0.25
200 600 1000
2 1
00 400 600
ID, DRAIN CURRENT (A) ID, DRAIN CURRENT (A)
TJ = 125°C TJ = 25°C
TJ = −55°C
2.00 3 5
VGS = 4.6 V to 10 V
3.0 V 0.75
300 300
1.50 100
500 800
500
VDS = 10 V
0
4.2 V
1.00 400
700
100 200
0.50 1.25 1.75
900
800 1000
700 900
4 4.0 V
3.2 V 3.4 V 3.6 V
Figure 7. Capacitance Variation Figure 8. Gate−to−Source Voltage vs. Total Charge
QG, TOTAL GATE CHARGE (nC) 80 40
00 2 4 6 5
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance Figure 10. Diode Forward Voltage vs. Current
Figure 11. Maximum Rated Forward Biased
Safe Operating Area Figure 12. IPEAK vs. Time in Avalanche
VDS, DRAIN−TO−SOURCE VOLTAGE (V) TIME IN AVALANCHE (s)
1000 10
1 0.10.1
10 100 1000
100 VGS, GATE−TO−SOURCE VOLTAGE (V)
ID, DRAIN CURRENT(A) IPEAK (A)
VDS = 20 V TJ = 25°C ID = 50 A
QGS QGD
TJ(initial) = 100°C
TJ(initial) = 25°C
0.00001 0.01
RDS(on) Limit Thermal Limit Package Limit
10 ms
0.5 ms 1 ms 10 ms TC = 25°C
Single Pulse VGS≤ 10 V
1000
0.0001 1
100 1
20 60
0.001 10
100 120
1 3
VDS, DRAIN−TO−SOURCE VOLTAGE (V) 100
RG, GATE RESISTANCE (W) VSD, SOURCE−TO−DRAIN VOLTAGE (V)
50 30
1E−082 1E−05
0.5
0.4 1.1
0.3 0.2 0.1 0.1
C, CAPACITANCE (pF)t, SWITCHING TIME (ns) IS, SOURCE CURRENT (A)
VGS = 0 V TJ = 25°C f = 1 MHz
CISS COSS
CRSS
VGS = 4.5 V VDS = 20 V ID = 50 A
td(off)
td(on)
tf
tr
TJ = 25°C TJ = −55°C 100K
1 0.1
VGS = 0 V 1K
1 1E−06
10K
10
TJ = 125°C 1E−07
14 22 26 34 42 46
10
10 0.6
TJ = 150°C TJ = 175°C
0.7 0.8 0.9 1.0 38
18 6
100 100
TYPICAL CHARACTERISTICS
Figure 13. Thermal Characteristics PULSE TIME (sec)
1000 10
0.1 0.0001
0.000001 0.001
R(t) (°C/W) 0.1 10 100
100 1
0.01
0.00001 0.001
1
Single Pulse Duty Cycle = 0.5 0.2
0.050.1 0.02 0.01
0.01
DEVICE ORDERING INFORMATION
Device Marking Package Shipping†
NVMTS0D6N04CLTXG 0D6N04CL POWER 88
(Pb−Free) 3000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
CASE 507AP ISSUE D
DATE 29 MAR 2021
XXXX = Specific Device Code A = Assembly Location WL = Wafer Lot Code Y = Year Code WW = Work Week Code
*This information is generic. Please refer to device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”, may or may not be present. Some products may not follow the Generic Marking.
GENERIC MARKING DIAGRAM*
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
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DESCRIPTION:
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