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NGTB40N120S3WG IGBT - Ultra Field Stop

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IGBT - Ultra Field Stop

This Insulated Gate Bipolar Transistor (IGBT) features a robust and cost effective Ultra Field Stop Trench construction, and provides superior performance in demanding switching applications, offering low switching losses. The IGBT is well suited for applications that require fast switching IGBT with low V

F

diodes, e.g. phase−shifted full bridge, etc. Incorporated into the device is a free wheeling diode with a low forward voltage.

Features

• Extremely Efficient Trench with Field Stop Technology

T

Jmax

= 175 ° C

Low V

F

Reverse Diode

• Optimized for High Speed Switching

• These are Pb−Free Devices

Typical Applications

Welding

• Uninterruptible Power Inverter Supplies (UPS)

• Motor Control

ABSOLUTE MAXIMUM RATINGS

Rating Symbol Value Unit

Collector−emitter voltage VCES 1200 V

Collector current

@ TC = 25°C

@ TC = 100°C

IC

160 40

A

Pulsed collector current, Tpulse limited by TJmax

ICM 160 A

Diode forward current

@ TC = 25°C

@ TC = 100°C

IF

160 40

A

Diode pulsed current, Tpulse limited by TJmax

IFM 160 A

Gate−emitter voltage Transient gate−emitter voltage (Tpulse = 5 ms, D < 0.10)

VGE ±20

±30

V

Power Dissipation

@ TC = 25°C

@ TC = 100°C

PD

454 227

W

Operating junction temperature range TJ −55 to +175 °C Storage temperature range Tstg −55 to +175 °C Lead temperature for soldering, 1/8″

from case for 10 seconds

TSLD 260 °C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.

TO−247 CASE 340AL C

G

40 A, 1200 V V

CEsat

= 1.7 V

E

off

= 1.1 mJ

E

Device Package Shipping ORDERING INFORMATION

www.onsemi.com

A = Assembly Location

Y = Year

WW = Work Week G = Pb−Free Package

MARKING DIAGRAM

40N120S3 AYWWG G

E C

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Rating Symbol Value Unit

Thermal resistance junction−to−case, for IGBT RqJC 0.34 °C/W

Thermal resistance junction−to−case, for Diode RqJC 0.5 °C/W

Thermal resistance junction−to−ambient RqJA 40 °C/W

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)

Parameter Test Conditions Symbol Min Typ Max Unit

STATIC CHARACTERISTIC Collector−emitter breakdown voltage, gate−emitter short−circuited

VGE = 0 V, IC = 500 mA V(BR)CES 1200 − − V Collector−emitter saturation voltage VGE = 15 V, IC = 40 A

VGE = 15 V, IC = 40 A, TJ = 175°C

VCEsat

1.7 2.3

1.95

V Gate−emitter threshold voltage VGE = VCE, IC = 400 mA VGE(th) 4.5 5.5 6.5 V Collector−emitter cut−off current, gate−

emitter short−circuited

VGE = 0 V, VCE = 1200 V VGE = 0 V, VCE = 1200 V, TJ = 175°C

ICES

− 0.5

0.4

mA Gate leakage current, collector−emitter

short−circuited

VGE = 20 V , VCE = 0 V IGES − − 200 nA

Input capacitance

VCE = 20 V, VGE = 0 V, f = 1 MHz

Cies − 4912 − pF

Output capacitance Coes − 140 −

Reverse transfer capacitance Cres − 80 −

Gate charge total

VCE = 600 V, IC = 40 A, VGE = 15 V

Qg − 212 − nC

Gate to emitter charge Qge − 43 −

Gate to collector charge Qgc − 102 −

SWITCHING CHARACTERISTIC, INDUCTIVE LOAD Turn−on delay time

TJ = 25°C VCC = 600 V, IC = 40 A

Rg = 10 W VGE = 15V

td(on) − 12 − ns

Rise time tr − 25 −

Turn−off delay time td(off) − 145 −

Fall time tf − 107 −

Turn−on switching loss Eon − 2.2 − mJ

Turn−off switching loss Eoff − 1.1 −

Total switching loss Ets − 3.3 −

Turn−on delay time

TJ = 175°C VCC = 600 V, IC = 40 A

Rg = 10 W VGE = 15 V

td(on) − 13 − ns

Rise time tr − 24 −

Turn−off delay time td(off) − 153 −

Fall time tf − 173 −

Turn−on switching loss Eon − 2.8 − mJ

Turn−off switching loss Eoff − 1.6 −

Total switching loss Ets − 4.4 −

DIODE CHARACTERISTIC

Forward voltage VGE = 0 V, IF = 40 A

VGE = 0 V, IF = 40 A, TJ = 175°C

VF

2.0 2.55

2.6

V Reverse recovery time

TJ = 25°C IF = 40 A, VR = 400 V

diF/dt = 500 A/ms

trr − 163 − ns

Reverse recovery charge Qrr − 2.9 − mc

Reverse recovery current Irrm − 30 − A

Diode peak rate of fall of reverse recovery current during tb

dIrrm/dt − 137 − A/ms

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ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)

Parameter Test Conditions Symbol Min Typ Max Unit

DIODE CHARACTERISTIC Reverse recovery time

TJ = 175°C IF = 40 A, VR = 400 V

diF/dt = 500 A/ms

trr − 250 − ns

Reverse recovery charge Qrr − 5.3 − mc

Reverse recovery current Irrm − 40 − A

Diode peak rate of fall of reverse recovery current during tb

dIrrm/dt − 482 − A/ms

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.

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9 V 8 V

Figure 1. Output Characteristics Figure 2. Output Characteristics VCE, COLLECTOR−EMITTER VOLTAGE (V) VCE, COLLECTOR−EMITTER VOLTAGE (V)

8 4

3 2 1 0 0 20 40 60 80 100 160

Figure 3. Output Characteristics Figure 4. Output Characteristics VCE, COLLECTOR−EMITTER VOLTAGE (V) VCE, COLLECTOR−EMITTER VOLTAGE (V)

0 0 20 40 60 80 100 160

Figure 5. Typical Transfer Characteristics Figure 6. VCE(sat) vs. TJ VGE, GATE−EMITTER VOLTAGE (V) TJ, JUNCTION TEMPERATURE (°C)

12 10 8 6 4 2 0 0 20 40 160

200 100

75 25

−25

−50

−75 1.0 1.5 3.5

IC, COLLECTOR CURRENT (A) IC, COLLECTOR CURRENT (A)

IC, COLLECTOR LOSS (mJ) VCE, COLLECTOR−EMITTER VOLTAGE (V)

VGE = 20 to 13 V TJ = 25°C

10 V

7 V

8 4

3 2 1 0 0 20 40 60 80 100 140

IC, COLLECTOR CURRENT (A)

VGE = 20 to 13 V TJ = 150°C

10 V 9 V 8 V 7 V

8 4

3 2 1 0 0 20 100

40 80 60 160

IC, COLLECTOR CURRENT (A)

VGE = 20 to 13 V TJ = −55°C

10 V

9 V 11 V

14

2.5 7−8 V

120 140

120

140

120 120

140

60 80 100

0 50 125 150

IC = 75 A 140

5 6 7

11 V

160

5 6 7

11 V

VGE = 20 to 13 V

10 V 9 V TJ = 175°C 11 V

8 V 7 V

TJ = 25°C TJ = 175°C

120

2.0 3.0

175 IC = 40 A

IC = 20 A

5 6 7 1 2 3 4 5 6 7 8

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TYPICAL CHARACTERISTICS

Figure 7. Typical Capacitance Figure 8. Diode Forward Characteristics

VCE, COLLECTOR−EMITTER VOLTAGE (V) VF, FORWARD VOLTAGE (V)

30 20 10 0 10 100 10,000

Figure 9. Typical Gate Charge Figure 10. Switching Loss vs. Temperature

QG, GATE CHARGE (nC) TJ, JUNCTION TEMPERATURE (°C)

200 150

100 50

0 0 4 8 16

0 3.3

Figure 11. Switching Loss vs. Temperature Figure 12. Switching Loss vs. IC

TJ, JUNCTION TEMPERATURE (°C) IC, COLLECTOR CURRENT (A)

0 1 10 1000

70 60 40

30 20 10 6

CAPACITANCE (pF) IF, FORWARD CURRENT (A)

VGE, GATE−EMITTER VOLTAGE (V) SWITCHING LOSS (mJ)

SWITCHING TIME (ns) SWITCHING LOSS (mJ)

100 1000

250 VCE = 600 V VGE = 15 V IC = 40 A

VCE = 600 V VGE = 15 V IC = 40 A Rg = 10 W

90 40

100

70

50

10 0

0 0.5 1.0 1.5 2.0 2.5 3.0 4.0 4.5

0.3

20 40 60 80 100 120 140 200

20 60 80 120 160 200

5

2

0 60

TJ = 25°C Cies

tf

td(on) tr td(off)

VCE = 600 V VGE = 15 V IC = 40 A Rg = 10 W

Eon

Eoff

100

VCE = 600 V VGE = 15 V TJ = 175°C Rg = 10 W 2

6 10 12 14

50 70 80 90

Coes

Cres

TJ = 175°C TJ = 25°C

3.5 20

30 40 60 80 90

Eon

Eoff 160 180 0.8

1.3 1.8 2.3 2.8

40 100 140 180

4 3

1

50 80

7

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Figure 13. Switching Time vs. IC Figure 14. Switching Loss vs. RG

IC, COLLECTOR CURRENT (A) Rg, GATE RESISTOR (W)

80 70 60 50 40 30 20 10 100 1000

60 50 40 30 10

0 9

Figure 15. Switching Time vs. RG Figure 16. Switching Loss vs. VCE

Rg, GATE RESISTOR (W) VCE, COLLECTOR−EMITTER VOLTAGE (V)

60 50 40 30 20 10 0 10 1000

750 700 550

400 350 0 0.5 2.0 3.5

VCE, COLLECTOR−EMITTER VOLTAGE (V) 1000 100

10 1

0.1 10 100 1000

SWITCHING TIME (ns) SWITCHING LOSS (mJ)

SWITCHING TIME (ns) SWITCHING LOSS (mJ)IC, COLLECTOR CURRENT (A)

90 VCE = 600 V

VGE = 15 V TJ = 175°C Rg = 10 W

70 VCE = 600 V

VGE = 15 V TJ = 175°C IC = 40 A

70

Single Nonrepetitive Pulse TC = 25°C Curves must be derated linearly with increase in temperature 1

7

4

2 0 10

100

450 500 600 650

VGE = 15 V IC = 40 A Rg = 10 W TJ = 175°C

tf

td(on) tr td(off)

1

dc operation

1 ms 50 ms 100 ms

Figure 17. Switching Time vs. VCE VCE, COLLECTOR−EMITTER VOLTAGE (V)

700 650 600 550 500 450 400 350 10 1000

SWITCHING TIME (ns)

750 100

Eon

Eoff

Figure 18. Safe Operating Area tf

td(on) tr td(off)

Eon

Eoff

tf

td(on) tr td(off)

1 3 5 6 8

20

VCE = 600 V VGE = 15 V TJ = 175°C IC = 40 A

800 1.0

1.5 2.5 3.0

800 VGE = 15 V IC = 40 A Rg = 10 W TJ = 175°C

10,000 4.5

4.0 10

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TYPICAL CHARACTERISTICS

Figure 19. Reverse Bias Safe Operating Area Figure 20. trr vs. diF/dt VCE, COLLECTOR−EMITTER VOLTAGE (V) diF/dt, DIODE CURRENT SLOPE (A/ms)

1000 100

10 1

100 1000

900 700

500 300

100 350

Figure 21. Qrr vs. diF/dt Figure 22. Irm vs. diF/dt diF/dt, DIODE CURRENT SLOPE (A/ms) diF/dt, DIODE CURRENT SLOPE (A/ms)

900 700

500 300

100 0 2

1100 100

0 10 30 50

Figure 23. VF vs. TJ TJ, JUNCTION TEMPERATURE (°C)

125 25

−25

−75 1.0 3.0

IC, COLLECTOR CURRENT (A) trr, REVERSE RECOVERY TIME (ns)

Qrr, REVERSE RECOVERY CHARGE (mC) Irm, REVERSE RECOVERY CURRENT (A)

VF, FORWARD VOLTAGE (V)

10,000 1100

1100 1

250

150

50 0 10

1 4 3 6

300 500 700 900

2.0

1.5 VGE = 15 V, TC = 175°C

100 200 300

TJ = 175°C, IF = 40 A

TJ = 25°C, IF = 40 A

TJ = 175°C, IF = 40 A

TJ = 25°C, IF = 40 A

TJ = 175°C, IF = 40 A

TJ = 25°C, IF = 40 A 5

20 40

75 100 175

0

−50 50 150 200

2.5 3.5

IF = 40 A IF = 80 A

IF = 20 A

VR = 400 V

VR = 400 V VR = 400 V

400

60

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Figure 24. Collector Current vs. Switching Frequency FREQUENCY (kHz)

1000 100

10

0.01 1

Figure 25. IGBT Transient Thermal Impedance ON−PULSE WIDTH (s)

0.1 0.01

0.001 0.0001

0.000001 0.0001

0.01 0.1 1

Figure 26. Diode Transient Thermal Impedance

1 0.00001

ON−PULSE WIDTH (s)

0.1 0.01

0.001 0.0001

0.000001 0.1

1

1 0.00001

50% Duty Cycle 20%

10%

5%

2%

Single Pulse

50% Duty Cycle 20%

10%

5%

2%

Single Pulse

RqJC = 0.34

RqJC = 0.50

0.001

Junction

C1 C2 R1 R2 Ci = ti/Ri

Duty Factor = t1/t2 Peak TJ = PDM x ZqJC + TC

Case

Cn Rn Junction

C1 C2 R1 R2 Ci = ti/Ri

Duty Factor = t1/t2 Peak TJ = PDM x ZqJC + TC

Ri (°C/W) Ci (J/W)

0.0039 0.0539 0.0314 0.0811 0.0186 0.1007

Case

Cn Rn

0.0897 1.8437 0.1115 0.0172

0.0154 0.0065

0.1 0

60 140 180

Ipk (A)

20 40 120

80 100 160

0.001

Ri (°C/W) Ci (J/W)

Ramp, TC = 80°C Ramp, TC = 110°C Square, TC = 80°C

Square, TC = 110°C

R(t), SQUARE−WAVE PEAK (°C/W)R(t), SQUARE−WAVE PEAK (°C/W)

VCE = 600 V, RG = 10 W, VGE = 15 V

0.01

0.000058 0.000427 0.001260 0.017265 0.023397 0.025095

0.001363 0.003395 0.073345 0.093146

0.022881 0.052571 0.078312 0.043705 0.060153 0.127694

0.128193 1.422617 0.246682 0.070293

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Figure 27. Test Circuit for Switching Characteristics

Figure 28. Definition of Turn On Waveform

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Figure 29. Definition of Turn Off Waveform

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TO−247 CASE 340AL

ISSUE D

DATE 17 MAR 2017

GENERIC MARKING DIAGRAM*

XXXXX = Specific Device Code A = Assembly Location

Y = Year

WW = Work Week G = Pb−Free Package

*This information is generic. Please refer to device data sheet for actual part marking.

Pb−Free indicator, “G” or microdot “ G”, may or may not be present.

SCALE 1:1

XXXXXXXXX AYWWG E2

L1 D

L

b4 b2

b E

0.25 M B AM c

A1 A

1 2 3

B

e

2X

3X

0.635M B AM A

S P

SEATING PLANE

NOTES:

1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.

2. CONTROLLING DIMENSION: MILLIMETERS.

3. SLOT REQUIRED, NOTCH MAY BE ROUNDED.

4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH.

MOLD FLASH SHALL NOT EXCEED 0.13 PER SIDE. THESE DIMENSIONS ARE MEASURED AT THE OUTERMOST EXTREME OF THE PLASTIC BODY.

5. LEAD FINISH IS UNCONTROLLED IN THE REGION DEFINED BY L1.

6.∅P SHALL HAVE A MAXIMUM DRAFT ANGLE OF 1.5° TO THE TOP OF THE PART WITH A MAXIMUM DIAMETER OF 3.91.

7. DIMENSION A1 TO BE MEASURED IN THE REGION DEFINED BY L1.

DIM MIN MAX MILLIMETERS

D 20.80 21.34 E 15.50 16.25 A 4.70 5.30

b 1.07 1.33 b2 1.65 2.35

e 5.45 BSC A1 2.20 2.60

c 0.45 0.68

L 19.80 20.80

Q 5.40 6.20 E2 4.32 5.49

L1 3.81 4.32 P 3.55 3.65 S 6.15 BSC b4 2.60 3.40 NOTE 6

4

NOTE 7

Q

NOTE 4

NOTE 3

NOTE 5

E2/2

NOTE 4

F 2.655 ---

2XF

PACKAGE DIMENSIONS

98AON16119F DOCUMENT NUMBER:

DESCRIPTION:

Electronic versions are uncontrolled except when accessed directly from the Document Repository.

Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.

PAGE 1 OF 1 TO−247

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Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,

Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,

Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,

Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,

Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,

Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,

Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees,