IGBT - Ultra Field Stop
This Insulated Gate Bipolar Transistor (IGBT) features a robust and cost effective Ultra Field Stop Trench construction, and provides superior performance in demanding switching applications, offering low switching losses. The IGBT is well suited for applications that require fast switching IGBT with low V
Fdiodes, e.g. phase−shifted full bridge, etc. Incorporated into the device is a free wheeling diode with a low forward voltage.
Features
• Extremely Efficient Trench with Field Stop Technology
• T
Jmax= 175 ° C
• Low V
FReverse Diode
• Optimized for High Speed Switching
• These are Pb−Free Devices
Typical Applications• Welding
• Uninterruptible Power Inverter Supplies (UPS)
• Motor Control
ABSOLUTE MAXIMUM RATINGS
Rating Symbol Value Unit
Collector−emitter voltage VCES 1200 V
Collector current
@ TC = 25°C
@ TC = 100°C
IC
160 40
A
Pulsed collector current, Tpulse limited by TJmax
ICM 160 A
Diode forward current
@ TC = 25°C
@ TC = 100°C
IF
160 40
A
Diode pulsed current, Tpulse limited by TJmax
IFM 160 A
Gate−emitter voltage Transient gate−emitter voltage (Tpulse = 5 ms, D < 0.10)
VGE ±20
±30
V
Power Dissipation
@ TC = 25°C
@ TC = 100°C
PD
454 227
W
Operating junction temperature range TJ −55 to +175 °C Storage temperature range Tstg −55 to +175 °C Lead temperature for soldering, 1/8″
from case for 10 seconds
TSLD 260 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
TO−247 CASE 340AL C
G
40 A, 1200 V V
CEsat= 1.7 V
E
off= 1.1 mJ
E
Device Package Shipping ORDERING INFORMATION
www.onsemi.com
A = Assembly Location
Y = Year
WW = Work Week G = Pb−Free Package
MARKING DIAGRAM
40N120S3 AYWWG G
E C
Rating Symbol Value Unit
Thermal resistance junction−to−case, for IGBT RqJC 0.34 °C/W
Thermal resistance junction−to−case, for Diode RqJC 0.5 °C/W
Thermal resistance junction−to−ambient RqJA 40 °C/W
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter Test Conditions Symbol Min Typ Max Unit
STATIC CHARACTERISTIC Collector−emitter breakdown voltage, gate−emitter short−circuited
VGE = 0 V, IC = 500 mA V(BR)CES 1200 − − V Collector−emitter saturation voltage VGE = 15 V, IC = 40 A
VGE = 15 V, IC = 40 A, TJ = 175°C
VCEsat −
−
1.7 2.3
1.95
−
V Gate−emitter threshold voltage VGE = VCE, IC = 400 mA VGE(th) 4.5 5.5 6.5 V Collector−emitter cut−off current, gate−
emitter short−circuited
VGE = 0 V, VCE = 1200 V VGE = 0 V, VCE = 1200 V, TJ = 175°C
ICES −
−
− 0.5
0.4
−
mA Gate leakage current, collector−emitter
short−circuited
VGE = 20 V , VCE = 0 V IGES − − 200 nA
Input capacitance
VCE = 20 V, VGE = 0 V, f = 1 MHz
Cies − 4912 − pF
Output capacitance Coes − 140 −
Reverse transfer capacitance Cres − 80 −
Gate charge total
VCE = 600 V, IC = 40 A, VGE = 15 V
Qg − 212 − nC
Gate to emitter charge Qge − 43 −
Gate to collector charge Qgc − 102 −
SWITCHING CHARACTERISTIC, INDUCTIVE LOAD Turn−on delay time
TJ = 25°C VCC = 600 V, IC = 40 A
Rg = 10 W VGE = 15V
td(on) − 12 − ns
Rise time tr − 25 −
Turn−off delay time td(off) − 145 −
Fall time tf − 107 −
Turn−on switching loss Eon − 2.2 − mJ
Turn−off switching loss Eoff − 1.1 −
Total switching loss Ets − 3.3 −
Turn−on delay time
TJ = 175°C VCC = 600 V, IC = 40 A
Rg = 10 W VGE = 15 V
td(on) − 13 − ns
Rise time tr − 24 −
Turn−off delay time td(off) − 153 −
Fall time tf − 173 −
Turn−on switching loss Eon − 2.8 − mJ
Turn−off switching loss Eoff − 1.6 −
Total switching loss Ets − 4.4 −
DIODE CHARACTERISTIC
Forward voltage VGE = 0 V, IF = 40 A
VGE = 0 V, IF = 40 A, TJ = 175°C
VF −
−
2.0 2.55
2.6
−
V Reverse recovery time
TJ = 25°C IF = 40 A, VR = 400 V
diF/dt = 500 A/ms
trr − 163 − ns
Reverse recovery charge Qrr − 2.9 − mc
Reverse recovery current Irrm − 30 − A
Diode peak rate of fall of reverse recovery current during tb
dIrrm/dt − 137 − A/ms
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter Test Conditions Symbol Min Typ Max Unit
DIODE CHARACTERISTIC Reverse recovery time
TJ = 175°C IF = 40 A, VR = 400 V
diF/dt = 500 A/ms
trr − 250 − ns
Reverse recovery charge Qrr − 5.3 − mc
Reverse recovery current Irrm − 40 − A
Diode peak rate of fall of reverse recovery current during tb
dIrrm/dt − 482 − A/ms
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.
9 V 8 V
Figure 1. Output Characteristics Figure 2. Output Characteristics VCE, COLLECTOR−EMITTER VOLTAGE (V) VCE, COLLECTOR−EMITTER VOLTAGE (V)
8 4
3 2 1 0 0 20 40 60 80 100 160
Figure 3. Output Characteristics Figure 4. Output Characteristics VCE, COLLECTOR−EMITTER VOLTAGE (V) VCE, COLLECTOR−EMITTER VOLTAGE (V)
0 0 20 40 60 80 100 160
Figure 5. Typical Transfer Characteristics Figure 6. VCE(sat) vs. TJ VGE, GATE−EMITTER VOLTAGE (V) TJ, JUNCTION TEMPERATURE (°C)
12 10 8 6 4 2 0 0 20 40 160
200 100
75 25
−25
−50
−75 1.0 1.5 3.5
IC, COLLECTOR CURRENT (A) IC, COLLECTOR CURRENT (A)
IC, COLLECTOR LOSS (mJ) VCE, COLLECTOR−EMITTER VOLTAGE (V)
VGE = 20 to 13 V TJ = 25°C
10 V
7 V
8 4
3 2 1 0 0 20 40 60 80 100 140
IC, COLLECTOR CURRENT (A)
VGE = 20 to 13 V TJ = 150°C
10 V 9 V 8 V 7 V
8 4
3 2 1 0 0 20 100
40 80 60 160
IC, COLLECTOR CURRENT (A)
VGE = 20 to 13 V TJ = −55°C
10 V
9 V 11 V
14
2.5 7−8 V
120 140
120
140
120 120
140
60 80 100
0 50 125 150
IC = 75 A 140
5 6 7
11 V
160
5 6 7
11 V
VGE = 20 to 13 V
10 V 9 V TJ = 175°C 11 V
8 V 7 V
TJ = 25°C TJ = 175°C
120
2.0 3.0
175 IC = 40 A
IC = 20 A
5 6 7 1 2 3 4 5 6 7 8
TYPICAL CHARACTERISTICS
Figure 7. Typical Capacitance Figure 8. Diode Forward Characteristics
VCE, COLLECTOR−EMITTER VOLTAGE (V) VF, FORWARD VOLTAGE (V)
30 20 10 0 10 100 10,000
Figure 9. Typical Gate Charge Figure 10. Switching Loss vs. Temperature
QG, GATE CHARGE (nC) TJ, JUNCTION TEMPERATURE (°C)
200 150
100 50
0 0 4 8 16
0 3.3
Figure 11. Switching Loss vs. Temperature Figure 12. Switching Loss vs. IC
TJ, JUNCTION TEMPERATURE (°C) IC, COLLECTOR CURRENT (A)
0 1 10 1000
70 60 40
30 20 10 6
CAPACITANCE (pF) IF, FORWARD CURRENT (A)
VGE, GATE−EMITTER VOLTAGE (V) SWITCHING LOSS (mJ)
SWITCHING TIME (ns) SWITCHING LOSS (mJ)
100 1000
250 VCE = 600 V VGE = 15 V IC = 40 A
VCE = 600 V VGE = 15 V IC = 40 A Rg = 10 W
90 40
100
70
50
10 0
0 0.5 1.0 1.5 2.0 2.5 3.0 4.0 4.5
0.3
20 40 60 80 100 120 140 200
20 60 80 120 160 200
5
2
0 60
TJ = 25°C Cies
tf
td(on) tr td(off)
VCE = 600 V VGE = 15 V IC = 40 A Rg = 10 W
Eon
Eoff
100
VCE = 600 V VGE = 15 V TJ = 175°C Rg = 10 W 2
6 10 12 14
50 70 80 90
Coes
Cres
TJ = 175°C TJ = 25°C
3.5 20
30 40 60 80 90
Eon
Eoff 160 180 0.8
1.3 1.8 2.3 2.8
40 100 140 180
4 3
1
50 80
7
Figure 13. Switching Time vs. IC Figure 14. Switching Loss vs. RG
IC, COLLECTOR CURRENT (A) Rg, GATE RESISTOR (W)
80 70 60 50 40 30 20 10 100 1000
60 50 40 30 10
0 9
Figure 15. Switching Time vs. RG Figure 16. Switching Loss vs. VCE
Rg, GATE RESISTOR (W) VCE, COLLECTOR−EMITTER VOLTAGE (V)
60 50 40 30 20 10 0 10 1000
750 700 550
400 350 0 0.5 2.0 3.5
VCE, COLLECTOR−EMITTER VOLTAGE (V) 1000 100
10 1
0.1 10 100 1000
SWITCHING TIME (ns) SWITCHING LOSS (mJ)
SWITCHING TIME (ns) SWITCHING LOSS (mJ)IC, COLLECTOR CURRENT (A)
90 VCE = 600 V
VGE = 15 V TJ = 175°C Rg = 10 W
70 VCE = 600 V
VGE = 15 V TJ = 175°C IC = 40 A
70
Single Nonrepetitive Pulse TC = 25°C Curves must be derated linearly with increase in temperature 1
7
4
2 0 10
100
450 500 600 650
VGE = 15 V IC = 40 A Rg = 10 W TJ = 175°C
tf
td(on) tr td(off)
1
dc operation
1 ms 50 ms 100 ms
Figure 17. Switching Time vs. VCE VCE, COLLECTOR−EMITTER VOLTAGE (V)
700 650 600 550 500 450 400 350 10 1000
SWITCHING TIME (ns)
750 100
Eon
Eoff
Figure 18. Safe Operating Area tf
td(on) tr td(off)
Eon
Eoff
tf
td(on) tr td(off)
1 3 5 6 8
20
VCE = 600 V VGE = 15 V TJ = 175°C IC = 40 A
800 1.0
1.5 2.5 3.0
800 VGE = 15 V IC = 40 A Rg = 10 W TJ = 175°C
10,000 4.5
4.0 10
TYPICAL CHARACTERISTICS
Figure 19. Reverse Bias Safe Operating Area Figure 20. trr vs. diF/dt VCE, COLLECTOR−EMITTER VOLTAGE (V) diF/dt, DIODE CURRENT SLOPE (A/ms)
1000 100
10 1
100 1000
900 700
500 300
100 350
Figure 21. Qrr vs. diF/dt Figure 22. Irm vs. diF/dt diF/dt, DIODE CURRENT SLOPE (A/ms) diF/dt, DIODE CURRENT SLOPE (A/ms)
900 700
500 300
100 0 2
1100 100
0 10 30 50
Figure 23. VF vs. TJ TJ, JUNCTION TEMPERATURE (°C)
125 25
−25
−75 1.0 3.0
IC, COLLECTOR CURRENT (A) trr, REVERSE RECOVERY TIME (ns)
Qrr, REVERSE RECOVERY CHARGE (mC) Irm, REVERSE RECOVERY CURRENT (A)
VF, FORWARD VOLTAGE (V)
10,000 1100
1100 1
250
150
50 0 10
1 4 3 6
300 500 700 900
2.0
1.5 VGE = 15 V, TC = 175°C
100 200 300
TJ = 175°C, IF = 40 A
TJ = 25°C, IF = 40 A
TJ = 175°C, IF = 40 A
TJ = 25°C, IF = 40 A
TJ = 175°C, IF = 40 A
TJ = 25°C, IF = 40 A 5
20 40
75 100 175
0
−50 50 150 200
2.5 3.5
IF = 40 A IF = 80 A
IF = 20 A
VR = 400 V
VR = 400 V VR = 400 V
400
60
Figure 24. Collector Current vs. Switching Frequency FREQUENCY (kHz)
1000 100
10
0.01 1
Figure 25. IGBT Transient Thermal Impedance ON−PULSE WIDTH (s)
0.1 0.01
0.001 0.0001
0.000001 0.0001
0.01 0.1 1
Figure 26. Diode Transient Thermal Impedance
1 0.00001
ON−PULSE WIDTH (s)
0.1 0.01
0.001 0.0001
0.000001 0.1
1
1 0.00001
50% Duty Cycle 20%
10%
5%
2%
Single Pulse
50% Duty Cycle 20%
10%
5%
2%
Single Pulse
RqJC = 0.34
RqJC = 0.50
0.001
Junction
C1 C2 R1 R2 Ci = ti/Ri
Duty Factor = t1/t2 Peak TJ = PDM x ZqJC + TC
Case
Cn Rn Junction
C1 C2 R1 R2 Ci = ti/Ri
Duty Factor = t1/t2 Peak TJ = PDM x ZqJC + TC
Ri (°C/W) Ci (J/W)
0.0039 0.0539 0.0314 0.0811 0.0186 0.1007
Case
Cn Rn
0.0897 1.8437 0.1115 0.0172
0.0154 0.0065
0.1 0
60 140 180
Ipk (A)
20 40 120
80 100 160
0.001
Ri (°C/W) Ci (J/W)
Ramp, TC = 80°C Ramp, TC = 110°C Square, TC = 80°C
Square, TC = 110°C
R(t), SQUARE−WAVE PEAK (°C/W)R(t), SQUARE−WAVE PEAK (°C/W)
VCE = 600 V, RG = 10 W, VGE = 15 V
0.01
0.000058 0.000427 0.001260 0.017265 0.023397 0.025095
0.001363 0.003395 0.073345 0.093146
0.022881 0.052571 0.078312 0.043705 0.060153 0.127694
0.128193 1.422617 0.246682 0.070293
Figure 27. Test Circuit for Switching Characteristics
Figure 28. Definition of Turn On Waveform
Figure 29. Definition of Turn Off Waveform
TO−247 CASE 340AL
ISSUE D
DATE 17 MAR 2017
GENERIC MARKING DIAGRAM*
XXXXX = Specific Device Code A = Assembly Location
Y = Year
WW = Work Week G = Pb−Free Package
*This information is generic. Please refer to device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”, may or may not be present.
SCALE 1:1
XXXXXXXXX AYWWG E2
L1 D
L
b4 b2
b E
0.25 M B AM c
A1 A
1 2 3
B
e
2X
3X
0.635M B AM A
S P
SEATING PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. SLOT REQUIRED, NOTCH MAY BE ROUNDED.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH.
MOLD FLASH SHALL NOT EXCEED 0.13 PER SIDE. THESE DIMENSIONS ARE MEASURED AT THE OUTERMOST EXTREME OF THE PLASTIC BODY.
5. LEAD FINISH IS UNCONTROLLED IN THE REGION DEFINED BY L1.
6.∅P SHALL HAVE A MAXIMUM DRAFT ANGLE OF 1.5° TO THE TOP OF THE PART WITH A MAXIMUM DIAMETER OF 3.91.
7. DIMENSION A1 TO BE MEASURED IN THE REGION DEFINED BY L1.
DIM MIN MAX MILLIMETERS
D 20.80 21.34 E 15.50 16.25 A 4.70 5.30
b 1.07 1.33 b2 1.65 2.35
e 5.45 BSC A1 2.20 2.60
c 0.45 0.68
L 19.80 20.80
Q 5.40 6.20 E2 4.32 5.49
L1 3.81 4.32 P 3.55 3.65 S 6.15 BSC b4 2.60 3.40 NOTE 6
4
NOTE 7
Q
NOTE 4
NOTE 3
NOTE 5
E2/2
NOTE 4
F 2.655 ---
2XF
PACKAGE DIMENSIONS
98AON16119F DOCUMENT NUMBER:
DESCRIPTION:
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1 TO−247
and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.