MOSFET – Single,
P-Channel, Small Signal, XLLGA3,
0.62 x 0.62 x 0.4 mm
-20 V, -223 mA
Features
• Single P−Channel MOSFET
• Ultra Small and Thin Package (0.62 x 0.62 x 0.4 mm)
• Low R
DS(on)Solution in 0.62 x 0.62 mm Package
• 1.5 V Gate Voltage Rating
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant
Applications
• Small Signal Load Switch
• Analog Switch
• High Speed Interfacing
• Optimized for Power Management in Ultra Portable Products
MAXIMUM RATINGS (TJ = 25°C unless otherwise stated)Parameter Symbol Value Units
Drain-to-Source Voltage VDSS −20 V
Gate-to-Source Voltage VGS ±8.0 V
Continuous Drain
Current (Note 1) Steady
State TA = 25°C ID −223 mA
TA = 85°C −161
t ≤ 5 s TA = 25°C −240
Power Dissipa-
tion (Note 1) Steady
State TA = 25°C PD 121 mW
t ≤ 5 s TA = 25°C 140
Pulsed Drain Current tp = 10 ms IDM −669 mA Operating Junction and Storage
Temperature TJ,
TSTG
-55 to
150 °C
Source Current (Body Diode) IS −121 mA
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s) TL 260 °C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
THERMAL RESISTANCE RATINGS
Parameter Symbol Max Units
Junction-to-Ambient – Steady State (Note 1) RθJA 1035 °C/W Junction-to-Ambient – t ≤ 5 s (Note 1) RθJA 895
http://onsemi.com
G (1)
S (2) P−Channel MOSFET
D (3)
−20 V 2.4 W @ −2.5 V 1.6 W @ −4.5 V
RDS(on) MAX ID MAX V(BR)DSS
MOSFET
XLLGA3 CASE 713AB D = Specific Device Code M = Date Code
D M 1 3.3 W @ −1.8 V
MARKING DIAGRAM 4.5 W @ −1.5 V
−223 mA
Device Package Shipping† ORDERING INFORMATION
NTNS3A91PZT5G XLLGA3
(Pb−Free) 8000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
1 2
3
(TJ = 25°C unless otherwise specified)
Parameter Symbol Test Condition Min Typ Max Units
OFF CHARACTERISTICS
Drain-to-Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = −250 mA −20 V
Drain-to-Source Breakdown Voltage
Temperature Coefficient V(BR)DSS/TJ ID = −250 mA, ref to 25°C 11 mV/°C
Zero Gate Voltage Drain Current IDSS VGS = 0 V,
VDS = −20 V TJ = 25°C −1.0 mA
Gate-to-Source Leakage Current IGSS VDS = 0 V, VGS = ±8.0 V ±2.0 mA
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage VGS(TH) VGS = VDS, ID = −250 mA −0.4 −1.0 V
Negative Threshold Temperature Co-
efficient VGS(TH)/TJ 2.1 mV/°C
Drain-to-Source On Resistance RDS(on) VGS = −4.5 V, ID = −100 mA 1.1 1.6 W VGS = −2.5 V, ID = −50 mA 1.5 2.4
VGS = −1.8 V, ID = −20 mA 2.0 3.3 VGS = −1.5 V, ID = −10 mA 2.5 4.5
Forward Transconductance gFS VDS = −5 V, ID = −100 mA 0.41 S
Source−Drain Diode Voltage VSD VGS = 0 V, IS = −10 mA −0.6 −1.0 V
CHARGES & CAPACITANCES
Input Capacitance CISS
VGS = 0 V, f = 10 kHz, VDS = −15 V
41 pF
Output Capacitance COSS 4.6
Reverse Transfer Capacitance CRSS 4.1
Total Gate Charge QG(TOT)
VGS = −4.5 V, VDS = −15 V, ID = −200 mA
1.1 nC
Threshold Gate Charge QG(TH) 0.1
Gate−to−Source Charge QGS 0.2
Gate−to−Drain Charge QGD 0.23
SWITCHING CHARACTERISTICS, VGS = 4.5 V (Note 3)
Turn-On Delay Time td(ON)
VGS = −4.5 V, VDD = −15 V, ID = −200 mA, RG = 2 W
41 ns
Rise Time tr 97
Turn-Off Delay Time td(OFF) 571
Fall Time tf 286
3. Switching characteristics are independent of operating junction temperatures.
TYPICAL CHARACTERISTICS
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
−VDS, DRAIN−TO−SOURCE VOLTAGE (V) −VGS, GATE−TO−SOURCE VOLTAGE (V) 4.0
3.0 2.5 2.0 1.5 1.0 0.5 00
0.1 0.3 0.4 0.6 0.7 0.9 1.0
3.0 2.5 2.0
1.5 1.0
0.5 00
0.1 0.3 0.4 0.6 0.7 0.9 1.0
Figure 3. On−Resistance vs. Gate−to−Source Voltage
Figure 4. On−Resistance vs. Drain Current and Gate Voltage
−VGS, GATE VOLTAGE (V) −ID, DRAIN CURRENT (A)
4.0
3.5 4.5
3.0 2.5 2.0 1.5 0.51.0
1.0 2.0 2.5 3.0 4.0 4.5 5.0
1.0 0.7
0.6 0.5 0.3
0.2 0.1 00 0.5 1.5 2.0 3.0 3.5 4.5 5.0
Figure 5. On Resistance Variation with Temperature
Figure 6. Drain−to−Source Leakage Current vs. Voltage
−VDS, DRAIN−TO−SOURCE VOLTAGE (V) 18 16 14 12 10 6
4 12 10 100 1000
−ID, DRAIN CURRENT (A) −ID, DRAIN CURRENT (A)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)−IDSS, LEAKAGE (nA)
RDS(on), NORMALIZED DRAIN−TO−SOURCE RESISTANCE 0.7 0.8 0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6
−50 −25 0 25 50 75 100 125 150 TJ, JUNCTION TEMPERATURE (°C)
VGS = −4.5 V ID = −100 mA
VGS = −1.8 V ID = −20 mA
3.5 0.2
0.5 0.8
VGS = −4.5 V
−4.0 V
−3.5 V
−3.0 V
−2.5 V
−2.0 V
−1.5 V
−1.8 V
−1.2 V 0.2 0.5 0.8
VDS = −5 V
TJ = 25°C
TJ = 125°C TJ = −55°C
1.5 3.5
TJ = 25°C ID = −0.1 A
0.4 0.8 0.9
1.0 2.5 4.0
VGS = −4.5 V TJ = 25°C
VGS = −2.5 V VGS = −1.8 V VGS =
−1.5 V
8 20
TJ = 85°C TJ = 125°C
Figure 7. Capacitance Variation Figure 8. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge
−VDS, DRAIN−TO−SOURCE VOLTAGE (V) QG, TOTAL GATE CHARGE (nC)
18 16 12
10 6
4 2 00 10 20 40 50 60 70 80
1.0 0.9 0.7
0.6 0.3
0.2 0.1 00 1 2 3 4 5
Figure 9. Resistive Switching Time Variation vs. Gate Resistance
Figure 10. Diode Forward Voltage vs. Current
RG, GATE RESISTANCE (W) −VSD, SOURCE−TO−DRAIN VOLTAGE (V)
100 10
101 100 1000
1.2 1.1 1.0 0.8
0.7 0.6 0.5 0.010.4
0.1 1 10
Figure 11. Threshold Voltage Figure 12. Maximum Rated Forward Biased Safe Operating Area
−VDS, DRAIN−TO−SOURCE VOLTAGE (V) 100 10
1 0.0010.1
0.01 0.1 1
C, CAPACITANCE (pF) −VGS, GATE−TO−SOURCE VOLTAGE (V)
t, TIME (ns) −IS, SOURCE CURRENT (A)−ID, DRAIN CURRENT (A)
TJ, TEMPERATURE JUNCTION (°C)
−VGS(th), GATE−TO−SOURCE THRESHOLD VOLTAGE (V) 0.85
−50 −25 0 25 50 75 100 125 150 ID = −250 mA
0.75
0.65
0.55
0.45 0.35
8 14 20
30
VGS = 0 V TJ = 25°C f = 10 kHz Ciss
Coss
Crss
VGS = −4.5 V VDD = −15 V ID = −0.2 A td(off)
td(on) tr
tf
0 3 6 12 15 18
9
0.4 0.5 0.8 1.1 1.2
−VDS, DRAIN−TO−SOURCE VOLTAGE (V)
VDS = −15 V TJ = 25°C ID = −0.2 A
0.9 1.3
TJ = 25°C TJ = 125°C
TJ = −55°C
VGS≤ −8 V Single Pulse TC = 25°C
RDS(on) Limit Thermal Limit Package Limit
dc 10 ms 100 ms 1 ms 10 ms QT
VDS VGS
QGS QGD
TYPICAL CHARACTERISTICS
Figure 13. FET Thermal Response t, TIME (s)
1E−02 1E−01
1E−06 0 200 400 600 800 900 1100 1200
R(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (°C/W) 1000
700 500 300 100
1E−05 1E−04 1E−03 1E+00 1E+01 1E+02 1E+03
RqJA Steady State = 1035°C/W
Duty Cycle = 0.5
Single Pulse 0.20
0.10
0.05 0.02 0.01
SOLDER FOOTPRINT*
DIMENSIONS: MILLIMETERS
0.35 0.62 0.20
*Dependent upon end user capabilities, this footprint could be used as a minimum.
0.20 MINIMUM RECOMMENDED
PITCH
2X
2X
0.28 1 0.60
2
3
ÉÉ
ÉÉ
CASE 713AB ISSUE O
DATE 25 SEP 2012 SCALE 8:1
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
A B
E D
BOTTOM VIEW b
TOP VIEW 0.10 C
A 0.10 C A1
0.10 C
C SEATINGPLANE SIDE VIEW
DIM MIN MAX MILLIMETERS A 0.340 0.440 A1 0.000 0.030 b 0.100 0.200 D 0.620 BSC
E 0.620 BSC
L 0.090 0.210
SOLDER FOOTPRINT*
DIMENSIONS: MILLIMETERS
0.760 0.350
0.200
*For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
1
GENERIC MARKING DIAGRAM*
*This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G”, may or not be present.
L2 0.110 0.310
L L2
0.280
RECOMMENDED
PITCH
E2 0.400 0.600 D2 0.175 BSC D3 0.205 BSC
e 0.350 BSC K 0.200 REF
0.10 C
A 0.10M C B 0.05 M C
2X
e
e/2 D3
E2
K
A 0.10M C B 0.05M C
2X
2X 2X
0.350 0.600 1
X = Specific Device Code M = Date Code
X M
PIN ONE REFERENCE
3X
D2
2
3
2
3
PACKAGE OUTLINE
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
98AON84074E DOCUMENT NUMBER:
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Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1 XLLGA3, 0.62X0.62, 0.35P
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