[PDF] Top 20 C93 2003 5 ETW 最近の更新履歴 Hideo Fujiwara

... 1. Introduction High level test synthesis ([1, 3, 4, 5, 6, 7]) has poten- tiality to reduce test cost drastically by utilization of high level information or abstraction. This paper simultaneously considers DFT ... 完全なドキュメントを参照

... SE-582 83 Linkoping, Sweden 8916-5 Takayama, Ikoma, Nara 630-0101, Japan erila@ida.liu.se fujiwara@is.aist-nara.ac.jp Abstract 1 We propose a test resource partitioning and optimization technique for ... 完全なドキュメントを参照

... P MUX =0.2P u . The peak power constraint is assumed to be P max =17.5 P u . If we resolve this example using adjacent non-scan BIST scheme the registers R4, R5, R6 and R7 can be enhanced to BILBOs and R1, ... 完全なドキュメントを参照

... w 1 during period 1 to 3. We need a mechanism to handle the different TAM bandwidths at each core. Several core test wrappers such as Boundary scan, TestShell and P1500 have been proposed. Recently Koranne proposed a ... 完全なドキュメントを参照

... 5. Conclusion This paper has presented a novel non-scan DFT method for controller-data path circuits designed at RTL. The proposed method can achieve 100% fault efficiency and allows at- speed testing. The hardware ... 完全なドキュメントを参照

... However, it is difficult to test SoCs after fabrication[1]. A major problem to make an SoC testable concerns acces- sibility of embedded cores. Several design-for-testability (DFT) techniques have been proposed. There are ... 完全なドキュメントを参照

... 5.2 Case Study In this case study, we evaluate the effectiveness of the proposed method in the hardware overhead required for ex- tracting DR-structure, the test generation time and the fault efficiency. The ... 完全なドキュメントを参照

... nents of TAM. We try to utilize existing interconnects and consecutive transparency of cores as much as possible to minimize hardware overhead. Only when a core is not con- secutively test accessible by using only ... 完全なドキュメントを参照

... Now we explain how to apply the typical method described above using the ES chain along the CLR. The ES chain can store and hold two bits for each control signal. Let l1 = 1, thru = 1, mt = 0, m6 = 0, m3 = 0, m5 = ... 完全なドキュメントを参照

... 5. Conclusion This paper proposed a test generation method using several PCTPTs for RTL data path. The optimization problem for test plan grouping is also formulated using ILP to shorten test length under a test ... 完全なドキュメントを参照

... g = off( f ), because, from Definition 5, L(P) is obtained by moving all the inverters on P to the primary input of P . Therefore, if a vector pair whose second vector is v is applied to C, all the off-input of P ... 完全なドキュメントを参照

... 5.3.1. Case 1: Scan only. In case 1, each core’s DFT was limited to scan design. The number of scan chains in each core is selected to reduce the total test application time. Table 2 shows the results of case 1. ... 完全なドキュメントを参照

... 4, 5, 6] proposed a test synthesis method considering This work is supported in part by Japan Society for the Promo- tion of Science (JSPS) under the Grant-in-Aid for Science Research ... 完全なドキュメントを参照

... 5. Evaluation of our test generation method 5.1. Characteristics of this work and prior works From Definition 8, we can see that the relation among three classes is as follows: the class of acyclic sequen- ... 完全なドキュメントを参照

... •5.Find the best sequence from si=(V1,……Vn)i. •6.Find the best sequence from (s1,s2,……,sk). Since the algorithm starts at each node, the complexity of this algorithms is O(n 2 k m ), where k, m are given integer ... 完全なドキュメントを参照

... A number of software based self-test approaches [4,5,6,7,8,9], targeting stuck-at faults, have also been proposed. Shen and Abraham [4] proposed an approach based on instruction randomization. This approach ... 完全なドキュメントを参照

... 5.3 マイクロプログラム制御 いくつかの制御信号を１語にまとめたのを制御語 一連の制御語をROMやRAM（PLAも可能）などのメモリに格納しておき それを順次取り出すことにより制御信号列を生成する制御方法を ... 完全なドキュメントを参照

... shows a window for designing GF 2 SR. After entering the necessary information for the design such as the number of flip-flops and logic expressions in JavaScript form for flip- flops, the circuit diagram is generated. ... 完全なドキュメントを参照

... type3 の制御経路，観測経路を用いることによ り， M に 属するすべての組合せ 回路要素を 同時にテ ストできる．このテ ストの間，制御経路及び 観測経路 に 現れ る制御信号（ テストプ ラン ）を固定し ておくこ とができる．つまり，一つのテ スト セッション M に 対し て ，一つの 制御パターン を 与えれば ，連続クロッ クでテ スト ... 完全なドキュメントを参照

... SoC の実動作速度での連 続し たテ スト 系列の 印加に 利用可能であ る． c の G J は 無閉路であるので ，条件 1 より， c の各入力端子に 対し て， SoC の外部入力から 一つ以上の単純経路が 存 在する．更に 条件 3 より，各コアは 一つの 形状が 選択 され ， G J ... 完全なドキュメントを参照