... The DFT method requires lower hardware overhead and shorter test generation time than the full scan method, and also improves test application time drastically compared with the full sca[r] ...
... Ehime University) for his critical reading of our draft. This study is supported in part by KAKENHI (24405028; principal investigator: S. O KAJIMA ). 要 約 吉富博之・M.-L. J ENG :ラオス産ハバビロドロムシ属(コウチュウ目ヒメドロムシ科)の 1 新種.― ア ...