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C52 1999 11 ATS 最近の更新履歴 Hideo Fujiwara

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IEEE the 8th Asian Test Symposium (ATS'99), pp. 192-199, Nov. 1999.

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PI1 PI2

PI3 C1 PO

C2

C3 C4

C5

C6

C7 FF2 FF1

FF3 FF4

FF5 FF6

FF7

FF8

PI1 PI2

PI3

PO C1

C2

C3 C4

C5

C6

C7

C2 PI3

PI1

PI2 C1

0 1 2 3 4

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T(t, i) = T (t, i)1 for 0 t < min{l , k}, k + l t < l 1 2 1 T(t, i) = T (t, i) T (t-k, i)1 c 2 for k t < min{l , k+l }1 2

T(t, i) = X for l t < k1

T(t, i) = T (t-k, i)2 for max{l ,k} t < k+ l 1 2

<=

<= <=

<=

<=

b b b X X b X X X b b X X X X

T T

Skew 2

c

b b b X X b b b b b b b X X X b b X X X X

T

b b b X X b X X X b b X X X X

(4)

0 1

2

5

3

4 6

7

C3

C1 C2

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Extract_max_clique(G) /* G = (V, E, t) */ {

C = { v s.t. t(v) == 0}; v=Best_vertex(S,C) ; }

return C ; }

Candidates (C) {

/* S is a set of vertices s.t. any vertex in C is compatible with them */ return S;

}

Best_vertex(S, C) /* heuristics */ {

V2 = { v | |nbr(v)| is maximum in V1}; V3 = {v | t(v) is minimum in V2}; return (one vertex selected from V3); }

while((S = Candidates(C)) ! = φ ){ C = C {v};

S = { v | v V - C u C, ∃ (u, v) E};

V1 = { v | Σ w(u, v) is minimum in S, u C};

6

5

4 3

2 1 0

0 1

1 1

1 1

2

2 5

5 5

c

c

Skew 6

c Skew 4

10

Eeffective length b b b

X X b X X X b b X X X X

b b b X X b X X X b b X X X X

Skew 2

b b b X X b X X X b b X X X X

b b b X X b X X X b b X X X X

b b b X X b b b b b b b b b b b b b b b b b b b X X X b b X X X X

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Test_generation_acyclic(S) {

Generate a time expansion model corresponding to S. Generate a template for a test sequence compaction.

(compacted N primitive templates)

} n = 0. {

Select a fault f from undetected fault set F.

Generate a test pattern for f in the time expansion model. Perform fault simulation for the time expansion model with the test pattern.

Remove detected faults from F.

Transform the test pattern into a test sequence with a test sequence compaction using the template.

n++; if (n= = N) {

Extract test patterns by a reverse transformation. Perform fault simulation for the time expansion model with the test patterns.

Remove detected faults from F. n = 0;

} }

for (undetedcted fault f F)

Time 0 1 2 4 3 5 6 7 8 9 10

PI1 PI2 PI3 Simulation

OK 0

X 0 1 0 0 1 1

1 X 1 1 0 1 1

0 1 0 1 0 1 0 1 X X 0

X X 1

X X X

OK OK OK Effective

length

Effective length of primitive template -1 0

Time 0 1 2

4 3

5 6 7 8 9 10

PI1 PI2 PI3 Simulation

OK 0

1

0 1

0 0 1 1

1 0

1 1

0 0 1 1

0

0 1

0 1 0 1 0

X 0

1

X 1

0

X 1

OK

OK

OK Effective

length

Extraction boundary 1

Extract 101100

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参照

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