Transparent conductive oxide layers
PC 61 BMAZOITO
4.4 Summary and conclusions
Table 4.4. Stability of the semitransparent and opaque devices with NiOx and PTAA HTL.
HTL Electrode combination Stability at MPPT
NiOx ITO / ITO 1100 h, no degradation
NiOx ITO / Ag 500 h, degrades 13%
PTAA ITO / ITO 100 h, degrades 24%
PTAA ITO / Ag 100 h, degrades 28%
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