トップPDF C111 2004 11 WRTLT 最近の更新履歴 Hideo Fujiwara
C111 2004 11 WRTLT 最近の更新履歴 Hideo Fujiwara
... It is, therfore, imperative to allow the BIST hardware be subjected (during the analysis) to the same defect level (impurity) as the functional circuits themselves. possibl[r] ...
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11 WRTLT pptx 最近の更新履歴 Hideo Fujiwara
... The security level of the secure scan architecture is determined by the probability that an attacker can identify the structure of the SR- quasi-equivalent circuit. Hence the attack p[r] ...
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J112 e IEICE 2004 3 最近の更新履歴 Hideo Fujiwara J112 e IEICE 2004 3
... All test vectors are applied but they can be partitioned into several sub test sets. In scan testing each test vector is shifted in (scanned in), and after a capture cycle, the test response is shifted out (scanned out), ...
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J114 e JETTA 2004 6 最近の更新履歴 Hideo Fujiwara J114 e JETTA 2004 6
... Received February 24, 2003; Revised February 12, 2004 Editor: K.K. Saluja Abstract. This paper suggests three techniques on non-scan DFT of sequential circuits. The proposed techniques guarantee 100% fault ...
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J111 e IEICE 2004 3 最近の更新履歴 Hideo Fujiwara J111 e IEICE 2004 3
... Table 4 Test application time (select from either Scan or NS-DFT). of the SoC. The 2nd column shows the maximum TAM width of each SoC. The 3rd column denotes the core num- ber denoted in Table 1. The 4th column shows ...
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11 WRTLT 最近の更新履歴 Hideo Fujiwara
... fujiwara@ogu.ac.jp Abstract—Scan design makes digital circuits easily testable, however, it can also be exploited to be used for hacking the chip. We have reported a secure and testable scan design approach by ...
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11 WRTLT pptx 最近の更新履歴 Hideo Fujiwara
... The security level of the secure scan architecture is determined by the probability that an attacker can guess right the structure of the. GF 2 SR circuit[r] ...
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S11 IEEE D&T 2004 7 最近の更新履歴 Hideo Fujiwara S11 IEEE D&T 2004 7
... Das (Jadavpur University, India), Hideo Fujiwara (Nara Institute of Science and Technology, Japan), Yungang Li (Beijing Huahong IC Design, China), Yinghua Min (Institute of Computing Tec[r] ...
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C112 2004 11 WRTLT 最近の更新履歴 Hideo Fujiwara
... Table1 shows a relation between input spaces and a sequence of instructions shown in Fig.1. An execution of each instruction consists of multiple cycles, and a state and values of inputs of a controller at each cycle are ...
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C113 2004 11 ATS 最近の更新履歴 Hideo Fujiwara
... Problem 1: Minimize the hardware overhead of a given data path under a boundary non-scan BIST, and a test scheduling algorithm, subject to a given power constrai[r] ...
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C115 2004 11 ATS 最近の更新履歴 Hideo Fujiwara
... T J (k•n) = O(τ(k•n)) (11) Condition 2 of definition 4 implies that for any pair of states (s i , s if ), there exists a fault propagation sequence and hence no backtrack occurs between fault propagation, state ...
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C116 2004 11 ATS 最近の更新履歴 Hideo Fujiwara
... The above Lemma basically reaches the definition of cover relation, as described in [9]. 2.4 Maximum TEG Definition 11: Given a TG G, a TEG E which cannot be covered by any other TEG of the TG except by its ...
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C114 2004 11 ATS 最近の更新履歴 Hideo Fujiwara
... E-mail: {kazuk-ka, kounoe, fujiwara}@is.naist.jp Abstract This paper presents a method of template generation for instruction-based self test of processor cores. A test pro- gram template is an instruction ...
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EPUB11田丸pdf 最近の更新履歴 epubcafé
... • を技術仕様 採用 こ 時点 文 未定義 あ 3.1 実装 • ン 文 移動 (Unicode 1.1 互換性消失 ) • ( 技術仕様 JIS X 0213:2004 対応 ) 2.1 1998 38,952 • 通貨記号追加 多少数 記号定義変更 3.0 1999 49,259 • CJK 統合漢 拡張 A 漢 6,582 文 追加 3.1 2001 94,205 ...
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11 IEICE 最近の更新履歴 Hideo Fujiwara
... のものを除き， k 段 SR 等価回路数 N (k) はちょうど， N (k) = 2 k !/k! − 1 となる． 表 2 に ， I 2 SR ， LF 2 SR ， LFSR ， LF 2 SR+I 2 SR ， LFSR+I 2 SR の 5 種 類 の ク ラ ス に つ い て ， SR 等 価 回 路 数 を 示 し た が ， LF 2 SR+LFSR ， LF 2 ...
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EPUB11田嶋pdf 最近の更新履歴 epubcafé
... ▪ 環境によって化ける可能性がある文字② フォントのバージョンによる変化 過去に印刷データ制作時に発生していたのと同様の、フォントの字形差による字形変化の問題も存在し ます。具体的には、小塚ゴシック Pro やリュウミン Pr5/Pr6 など、JIS90 字形を基準としたフォントで作 られた印刷データをもとに電子書籍を制作し、今後一般的に使用されると思われる ...
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C107 2004 5 ETS 最近の更新履歴 Hideo Fujiwara
... E-mail: {tsuyo-i, ohtake, fujiwara}@is.naist.jp Abstract This paper proposes a non-scan design scheme to en- hance delay fault testability of controllers. In this scheme, we utilize a given state transition graph ...
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C108 2004 5 ETS 最近の更新履歴 Hideo Fujiwara
... The complexity of scan tree architecture generation to find the optimal solution depends on the number of test patterns and scan cells.. This problem is NP-complete.[r] ...
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NewsLetter11 最近の更新履歴 GCOEアジア保全生態学 NewsLetter11
... already been reported (e.g. Kumagai et al. 2004; Saitoh et al. 2005). However, several phenomena such as the effects of unpredictable intra-annual dry spells on gas exchange properties via the physiological ...
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Lec1 11 最近の更新履歴 yyasuda's website
... The classical measure of welfare change is consumers’ surplus (CS) , which is the area below the Marshallian demand curve and above market price... That is, EV (resp. CV ) requires to ke[r] ...
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