Ballistic-Electron-Emission Microscopy at
Epitaxial Metal/Semiconductor
Interfaces(STM-BEEM interfaces)
著者 Kanel Hans, von, Meyer Thomas, Sirringhaus Henning, Lee Edwin, Y.
journal or
publication title
Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy volume 44 number 2 page range 157-163 year 1997-03-31 URL http://hdl.handle.net/10097/28727