V−V・・tica1 Single−Sid6d Split …i…i…i i…i…i… …i…i…
＋Detouched Corners （Grade 2）
L＝Left Single−Sided Split
＋Detouched Corners iiiiii 蕪i iiiiii （Grade 3）
R＝Right Single−Sided Split 、．、．． 。．．．． ．．．．．．
＋Detouched Corners iiiii iiiii iiiiii （Grade 4）
P＋ニSingle−Sided Split ．．。． 。。．．．
with Touched Corners iiiii iiiii
ぷ （Grade 5） iiiii
L＋Q＝LShape and Square Shape iiiii・濱ii iiiiii iiiiii iiiii・ iiiii ＋Detouched Corners iiiiii …iiiii iiiiii iiiii
（Grade 6） （
Fig．3．16：Definition of GRADE of CCD events．
Contamination Crrection
The OBF has been gradually contaminated in time by out−gassing from七hg satellite・The contamination rate af−ter the XIS door−open is unexpectedly high， an4 the rate is dierent from sensor to sensor． Moreover， the thickness of the contamina七ion varies with position on the OBF． ．、・口／
The contamination has caused a signicant reduction in low−ene「9y∴resPonse since launch． We therefore need to include additiona1， time−varying 16w・e血亘gy absorption in the response function． This is given as a function of bo七h the obSer這亘on date after the XIS d・・r−・pen， and・fde−tect・r c・・rdinates（speci封ing the p・si雌1鱗the OBF）・F・r this purp・se， we m・asured the・n−axis extra abs・rp−ti・n by・bserプi聴§黙・E…2−72 and an isolated neu． tron star RX J1856．5＿3754． At the time「
盾?ｰiti雌；We have not
c。nclusively d，termined the chemical c。mp・si一七i・n f・r the c・ntaminatibn material（s）．恥。m th，。vera11、pectral shape in the l。w ener留abs・rpti・n f・r al助鰹ailable X−ray
3．1． THE 5UZ、4κσSATELL∫TE 47 sources and the best guess for the out−gassing source in 5μzαkμ， we assume that the
contami−nant contains predommantly C and O with the number ratio C／06． Figure
3．17shows the time histories of the contamination accumulated on the OBF． Empirically，the time dependellce of the contamination thickness is assumed to follow the exponential
fbrm as；凡＝α一b×exp一ぬy／c，where IV』is the caエbon column dellsity in units of
1018cm−2（C／O＝6）． To measure the of壬axis absorption， we used diuse X−rays f士om the bright Earth rim and the Cygnus Loop， The fbrmer emits characteristic K hnes of NI and OI（neutral atoms）and the latter provides K lines丘om Cvl， NvII， OvII and Ovll【（He−like or H−like atoms）． Since the fbr−mer can be observed fごequently， we trace the time history of o−axis absorption over successive one−month periods after the XIS door−open
（13August，2005）． With the two reasonable assumptions that（1）the N：01ine ratio is
uniform over the eld of view and（2）the contamination is azimuthally constant， we can derive the radial prole of the dierence of contamination thickness hlom the center value．We show the radial proles of the column den−sity of carbon in gure 15 for one month and ve months after the door−open． This radial prole is approximated by a function of 1／［1十｛r／α（τ）｝b（りLThe time dependent parameters，α（ε）and b（りare determined and
up−dated regularly
2005／「0 2006／01 200WO4 2006 07
7↓ ↓．↓ ．↓、 5 ． ．．」
べ，姜：1； ．…／．］ 干・・一・…一．．一．、 美li1鵠綱
，°1∈ ．，
E．ζll； ／パジ ．． 蠕［ ＼、
．． 日 4「 ㍉、o ＿ ン ー
＝ ： ノ ，． ） 3
」・、 〃ll：：弓パ 三 』
ε1ご 、多・！ 81
0
、 ］
0． ． ．・1 0 50 100 150 200 250 300 350 400 0 2 4 6 8 10 12 Daysafter 2005−08−BO953：20 Radius〔aτcm輌皿）
Fig．3．17：Left：The time history of the contamination of all fbur XIS detectors， measured at the center of the OBF． The dotted and solid line denoted the models used by CALDB file of 2006−5−24 and 2006−10−24 version、 respectively Right：The radial prole of the contamination of the BI（XIS1）．
3．1．4 Uncertainties of Metal Abundance
We must consider three uncertaities for metaI abundance， especially oxygen and magne−
sium， analizing the spectra of XIS．
1．Systematic uncertainties（NXB and CXB level， gain and CTI correction and so on．）
2．Our Galactic compollents
48 CHAPTER 3．刀VSTRσMEN工4皿ON
3．Contamination on XIS
（1）：We check the e丘ects by changing the NXB and CXB levels by土10％．（2）：Because the O VII and O VIII lines emitted ffom ICM are coupled with these emitted from our Galaxy， the estimation of the emission from our Galaxy is very impotant to decide the oxygen abundance of ICM．（3）：As descibed in 3．1．3， because七he observed spectra are absorbed by the contaminant on XIS， the effect are taken into account with the・arfs，
and we also check the uncertainty of the arfs by changing the amo皿t of contaminant by
10〜20％．
It is the negligible effects for the central brightness region of the cluster， however it is the severe effects， especially（2）and（3）， for the faint region such as the ou七skirts of the cluster． Especialy the soft X−ray band（below〜1 keV）， the effects of（2）and（3）are impotant． Thus， we are careful to analyze the spectra for the decision of the oxygen and
magnesium abundance． In addtion， the abundance may vary whether we use a one or
multi temperature mode1．
3．2， XMルF∧rE回／τ01V 49
3．2 Xルθレf」ハ「eω‡oγλ
The ESA（European Space Agency）X−ray satellite XMル臼Veω諺oπwas launched on 10
December 1999 from Kourou（French Guiana），by the Ariane−V rocket（Jansen et aL 2001）．It was placed into a highly eccentric orbit， with an apogee of about 115．000 km， a perigee of about 6，000 km， and an orbital inclillation of 33°． which provides the best visibility in the southern celestial sky Although the orbital period is 48 hours， the exposure available for scientific data analysis is limited to 39 hours（140 ksec）per orbit． This is because observations are not carried out when the satellite altitude is less than 46，000 km， where the radiation background related to the Earth s magnetosphere is severe． XMル仁Areぴoれ provides the following three types of science instrument．
●European Photon Imagillg Camera（EPIC）
●ReHection Grating Spectrometer（RGS）
●Optical Monitor（OM）
The three EPIC calneras；the two dif飴rellt types of GGD camera， MOS and pn， and the two detectors of the RGS spectrometers reside in the fbcal planes of the X−ray telescopes，
while the OM has its own telescope． A sketch of the XルfM∫Ve庇oηpayload is displayed
in Fig．3．18．
、 こ一，一
一『．『．．〉 円⊥一一． @ ・．・●
Fig．3，18：Sketch of the XMM／Ve7〃亡oπpayload． The mirror modules， two of which are equipped with Reflectioll Grating Arrays． are visible at the lower left． At the right end of
the assembly the fbcal X−ray instruments are shown：The EPIC MOS cameras with their
radiators（black／green horns）， the radiator of the EPIC pn camera（violet）and those ofthe（light blue）RGS detectors（in pink）． The OM telescope is obscured by the lower
m辻ror module．
50 CHAPTER 3．1N8TRσMENΣAT∫ON
There are in total six science instruments on board XM1匹Ne励oη， which are operated
simultaneously The instruments can be operated independen七ly and each in different
modes of data acquisition．In the following sections， we describe the X−ray telescopes and EPIC cameras， because
we mainly use these instruments in our study We sulnmarize the basic performance of
the EPIC cameras in table 3．6．Table 3．61 Basic performance of the EPIC detec七〇rs
EPIC−MOS EPIC−pn
111uminatioll me七hod Front illuminated Back illumina七ed Pixel size 40μm 150μm
ノノ
1．1 4．1 Field of view（FOV） 30 30
PSF（FWHM／HEW）5 ／14 6 ／15
Spec七ral resolution 〜70 eV 〜80 eV Timing resolu七ion 1．5 ms O．03 ms・ Bandpass O．15−12keV O．15−15keV
3．2．1 X−ray Telescopes Design Structure
XMMNeω舌oη，s three XRTs are co−aligned with an accuracy of better七han about l arcmin．
Each of the three telescopes consists of 58 Wolter type−I mirrors， and the mirror grazing incidence angles range between 17 and 42 arcmin． The focal length is 7．5 m and the diameter of the largest mirrors is 70 cm． One telescope with the PN camera at the focal poin七has a ligh七path as shown in Figure 3．19． The two o七hers have grating assemblies in their light paths， diffracting part of the incoming radiation onto their secondary focus
（see Figure 3．20）． About 44％of七he incoming light focused by the XRT is direc七ed onto the MOS camera at七he prime focus， while 40％of the radiation is dispersed by a grating array on七〇alinear strip of CCDs． The remaining light is absorbed by the support structures of the RGAs．
Point−spread Function（PSF）of XRTs
Apoint−spread function（PSF）determines the imaging quality of an XRT． Figure 3．21
shows the in orbit on−axis images obtained by each detector． The radial substructures are caused by the spiders holding the mirror shells． Figure 3．22 displays the azimuthally averaged profile of the PSF of one XRT together with七he best−fit King profile， which has the form．4（1／［｛1一ト（r／γ・c）2｝α］）， where r is the radial distance from the center of the PSF， r， is the core radius andαis the slope of the King mode1． Figure 3．22 shows3．2． XM］レ仁NE W7「0∫V 51
Fig．3．19：The light path in XM1匹Ne庇oη，s XRT with the PN camera in focus．
Fig．320：The light path in XMM−∫Ve庇oη，s XRT with七he MOS camera and RGA．
the encircled energy function（EEF）as a function of radius from the center of七he PSF for several different energies． For on−axis source， high energy photons are reflected and focused predominantly by the inner shells of the XRTs． The inner shells apparently give better focus than the average of all shells， hence the EEF increase with increasing photon energy． A half energy width（HEW）， which means the width including half of all the re且ected photons， of the PSF can be derived from EEF． Table 3．71ists the on−axis HEW of the different XRTs measured in orbit and on ground．
The PSFs of the XRTs depend on七he source off−axis angle． As the ofLaxis angle increases， the HEW of PSF becomes larger．
Table 3．7：The on−axis in orbit and on ground 1．5 keV HEW of the di丘erent XRT．
Instr． PN MOSI MOS2
0rbi七／ground orbit／ground orbit／ground
HEW［arcsec］ 15．2／15．1 13．8／13．6 13．0／12．8
52 CHAPTER 3．∫NSTR UMEN工4nON
Fig．3．21：011−axis images of the NIOSI． MOS2 and PN XRTs（lef亡to right）． The illlages arや110 arぐsec wide and a logarithmi⊂scale has been used to visualize the willgs of the poillt spread fllnctiol1．
、↓ど 1S
rl．人，1L…「」｜ ⊂．ご1ド㌧
．＝1＝@iS ．．［cに」 堰D．
Fig．3．22：Left：Radial co／111ts distriblltion for the olトaxis PSF of t｝1e MOSI XRT ill the O．752．25keV ellergy range． The solid line hldicates the best．fit Killg profile． Right：Thp ellcircled ellergy fuIlction as a functioll of arlgular radius （ol←axis）at different energies・
The ulrves are calclllated assllming a fractional ellcircled ellergy ofユ00％at a radial
distallce of 5 arclllin．
Effbctive Area（EA）of XRTs
An e任ective area is an illdicator of ability of collectillg photolls． Xハ∫〜しみNξ1L肋ηcarries the XRT with the largest effective area of focusing telescope ever、 The total Inirror geometri（・
effective area（EA）at l．5 keV energy is abollt 1，550 cm2 for each telescope． i，e．、4，650 cm2 ill total． Figllre 3，23 shows the o1㍗axis effective arca of all工MA五NεωroηXRTs， The EAs of the two MOS canleras are lower than that of†he pn， because o111y part（）f the in（：omhlg radiation falls ollto these detectors． which are partially obscllred by the RGAs
（see Figllre 3．20）． Not only the shape of the X−ray PSF． bllt also the effective area of the XRT is a functioll of ofLaxis allgle witllin the 6eld of vipw． Decreasillg of photolls reHected effp℃tivelv in thp XRT arises froln an increasillg ofraxis angle． This effect is called vigllettillg． Figure 3．23 rlisplays the vigllettillg fullctioll as a hmction of〈）H二axis allgle for several differellt olergies． The vertical axis is IlormεL］ize（l by the o1←axis effp（寸ive area．
3．2 X凡∫ハ∫−N」…7Wτ0∧∫ 53
L．．、 ．、、：．v ヤ ．、 〆 ．「r、「
ジ．．FL．
v i 7 ・ ）
「 ，．：
L：．@〉 「．・．層 旨．．．1
Fig．3．23：Left：The net effective area of all XMλ1−Neωfoγ↓XRT， combined with the response characteristics of the focal detectors． Rightl Vignettillg fllnction as a fullctioll of o圧axis allgle at several different energies（based on silnlllations）．
Straylight Rejection
X−ray straylight is produced by rays which arp sillgly reflected by the mirror hyperbolas and which reach the sellsitive area of the focal plain detectors， Thlls． an X−rav bafHe was iInplemented to shadow those sillgly reflected rays， It consists of two sieve plates made ofぐ011℃entric al▲ll111ar apertllre stops located ill仕ont of the Hlirrors at 851nm alld 145mm． respe℃tively The design is such that the elltrallce annular apertllre of each mirror remaills unobstructed for on−axis rays． Theぐ011ecting area of straylight in the EPIC detector as a fmlction of ofFaxis angle for a poillt source is about 3 cll12 for stray sollrces located betweerl 20 arcmill and 1，4二fro111 the optical axis， The ratio of the X−rav straylight collecting area to the on−axis effeぐtive area is slnaller thal10．2％at l．5keV for a point sollrce located at offLaxis allgles of O．4．1．4二and negligible at higher of｝axis angles．
Figllre 3，24 displays the effect of straylight， which is obtailled丘onユthe observatioll of GRS 1758−258（a black hole calldidate near the Galactic center）． Some sharp arcs are causやd by single rnirror reHections of photolls possibly from GX 5−l which is Iocated at ofFaxis angle of 40 arcmin to the north and olltside the field of view．
Fig．3．24：The effやct of strayligllt appeared ill PN image of GRS l758−258．
54 CHAPTER 3．工NSTRσMEN工4質ON
3．2．2 European Photon Imaging Camera（EPIC）
Two of XMM−Ne励oη，s X−ray telescopes are equipped with EPIC MOS（Metal Oxide
Semi−conductor， Turner e七al．（2001））CCD arrays， the third carries a different CCD camera called EPIC PN（Str廿der e七al．2001）． The EPIC cameras offer the possibility to perform extremely sensitive imaging observations over a丘eld of view of 30 arcmin and the energy range from O．15 to 15 keV， with moderate spec七ral（E／△E〜20−50）and angular resolution（15 arcsec HEW）． The de七ec七〇r layout and the ba田ed X−ray telescope FOV of both types of EPIC cameras are shown in Figure 3．25． The PN chip array is slightly offset with respect to the optical axis of its X−ray telescope so that the nominal， on−axisobserving Position does nb七fall on the central chip boundary This ensures七ha七more
than 90％of the energy of an on−axis point source are collected on one PN CCD chip．Two EPIC MOS cameras are rotated by 90°with respect to each other． The dead spaces between the MOS chips are not gaps， but皿usable areas due七〇detector edges（七he MOS chip Physically overlap each other， the central one being located slightly behind the ones in the out曾r ring）． All EPIC cameras are operated in photon counting mode with a fixed，
mode dependent ffame read−out・frequency．
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EP皿：伽皿〕5 EPI〔：P罰
7CCD5田血10．9エ10．9 a皿血皿t日 並CCロ5田由13』エ4』a皿血㎞
Fig．3．25：Arough sketch of七he field of view of七he two types of EPIC cameras（MOS，
1efヒ；PN， right）． The shaded circle depicts a 30 arcmin diame七er area which is equivalent with the XRT field of view．
3．2．XMM 1四レγZ701V 55
Angular Resolution
The EPIC MOS and PN cameras have pixels with sizes of 40 and 150μm， respectively For 七he focal length of the X−ray七elescopes（7．5 m），these pexel size corresponds to 1．1 arcsec and 4，1 arcsec on the sky Since they are smaller than the HEW of XRT（15 arcsec），
EPIC，s angular resolution is basically determined by the PSF of the mirror modules．
Energy Resolution
The resolving power of EPIC cameras is de七ermined by the intrinsic energy resolutioll of 七he individual pixels． Figure 3．26 and 3．26 show the energy resolution（FWHM）of MOS and PN， respectively The measured in一且ight FWHM of the Al Kα（1．5 keV）and Mn Kα
（5．9keV）， which are the on−board calibra七ion lines， are also plotted in Figure 3．26． It is well known that the energy resolution of MOS cameras has been gradually decrease due to the CTI（charge transfer inefHciency）efFect， which means the imperfect七ransfer of charge as it is transported through the CGD to七he output amplifiers． The latest calibration status is found at XMMlVeω舌oηScience Operation Centre．1 The accuracy of the energy determination is about 10 eV over the full energy range and for all modes except for MOS
timing mode．
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