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Test Procedure SECO-NCD5700-GEVB

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Test Procedure SECO-NCD5700-GEVB

Test procedure requires

• One 4 channel oscilloscope

• 10V to 15V wall adapter for test board power supply (OD 6.5 mm)

• One test board provided by ON Semiconductor.

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Device under test (DUT)

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Connect DUT to channel number 6

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1) Plug 10V to 15V DC

2/Adjust frequency around 16 kHz (measure on opened J72)

3/Adjust duty cycle to 50%

4/ Place jumper on position J72

5/Connect J58.4 to J55.2 6/ Place jumper on position J72

7/Open J60 and close J57

Prepare measurement according steps below

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Measurement by scope

ChA

ChC

ChD

ChA: Measure voltage across J58.1 and GND on test point close to BNC connector

ChC: Measure voltage across G pin on the DUT and ISO GND on test point ISO3_0V

ChD: Measure voltage across shunt resistor

SHUNT_6

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Same periodic signals has to be visible

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Detail for positive pulse only

参照

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