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J112 e IEICE 2004 3 最近の更新履歴 Hideo Fujiwara J112 e IEICE 2004 3

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Fig. 2 Flexible scan-chains design at a core test wrapper.
Table 1 Design data for benchmark IC [1].
Figure 4 also illustrates that each core can be assigned to a different number of TAM wires when its test vectors are split up into several sessions, i.e
Table 3 Test schedule for IC at TAM size 40.
+3

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