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J111 e IEICE 2004 3 最近の更新履歴 Hideo Fujiwara J111 e IEICE 2004 3

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Fig. 1 Framework of SoC test architecture generation with consideration to DFT selection.
Fig. 3 Relationship between scan chain length and number of chains.
Fig. 5 DFT selection algorithm.
Fig. 6 Lower bound case of test application time.
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