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To learn more about onsemi™, please visit our website at www.onsemi.com

ON Semiconductor Is Now

onsemi and       and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. The information herein is provided “as-is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/

or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. Other names and brands may be claimed as the property of others.

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Signal Integrity

Considerations for Module Design

Introduction

To assist our customers with the module layout process, this application note describes layout best practices for mobile imaging module design. A list of recommendations is also provided to assist with design decisions in the layout process.

A few fundamental signal integrity (SI) concepts are presented in order to understand the background for the design recommendations that are offered. This is by no means an exhaustive description of a complex subject, but offered to help the module designers in understanding the reasoning for the design guidelines.

Signal Integrity and EMI

Electromagnetic interference (EMI) is defined as unwanted, conducted, or radiated signals of electronic origin that can cause degradation of system performance, while signal integrity refers to methods that ensure electrical signals are of sufficient quality for proper operation.

Examples that affect signal integrity include crosstalk, ringing, ground bounce, and power supply noise. Failure to plan for induced noise can cause the final design to work incorrectly, affect image quality, force redesigns, and lower yield.

Although we are not specifically discussing EMI in this application note, techniques to reduce SI will often result in lowering overall system EMI. The next sections provide details about signal integrity and EMI:

Frequency and Time Domain Relationship

Inductance, Mutual Inductance, and Mutual Capacitance

Thermal Considerations

Frequency and Time Domain Relationship

The first concept is that a digital waveform observed in the time domain is a combination of a sum of multiple harmonics in the frequency domain (see Figures 1 and 2).

Non-sinusoidal signals can be described as a combination of multiple sinusoidal frequencies of various amplitudes. One must think of each frequency traveling down the signal path individually and how that signal might be affected by the RLC effects of the signal path and then the sum of all of the frequencies are combined at the endpoint. The result of combining all of the individual frequencies is that if every frequency of concern is unaffected by the signal path, then one would have the same waveform at the endpoint as in the beginning. If any particular frequency is affected by the

signal path, then the overall signal becomes distorted. If the resulting waveform is highly distorted, this could affect the proper operation of your system.

Figure 1. Time Domain of a Trapezoidal Pulse

A 90%

50%

10%

tp

tr t Pw

Figure 2. Frequency Domain of a Trapezoidal Pulse log A

log f f0+ 1

ptp

f1+ 1 pPw

f2+ 1 ptr

In trying to determine the bandwidth of interest of a particular signal, one must typically focus on the fast rise and fall times of the signals involved. If one observes a clock square wave, with a rise time of tr, one could use a basic rule of thumb that the bandwidth involved in the frequency domain would be in Figure 2. For example, a digital waveform with a 500 ps rise time would generate frequencies of interest to 636 MHz. A slower rise time will generate less high frequency signals and overall magnitudes will decrease. This is the reason to utilize slew rate control where possible. Slew rate control also reduces EMI.

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APPLICATION NOTE

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Inductance, Mutual Inductance, and Mutual Capacitance Capacitive coupling of two electric fields occurs when current is injected in the victim line proportionally to the dV/dT of the aggressor line. This is one form of crosstalk.

Figure 3 shows how the electric field would interact such that the signal appearing on the aggressor line appears on the victim line.

Figure 3. Self and Mutual Capacitance

Ground Plane Conductor

Victim Line

Dielectric

Electric Field Lines Aggressor Line

Self-inductance can be described as the ratio of the magnetic flux produced from a current through a conductive path. The current produces a magnetic field that stores energy. However, magnetic fields in other nearby wires or structures will couple energy and interact with each other.

This is another form of crosstalk.

Figure 4 provides a visual example of how the magnetic fields would interact. If the two traces are brought physically closer together, then the magnetic field lines begin to interact with each other.

Figure 4. Self and Mutual Inductance

Ground Plane Conductor

Dielectric Magnetic Field Lines

The effect of the adjacent inductive coupling depends upon the direction the adjacent current is flowing. If we imagine a high frequency signal traveling in a wire loop, we can describe the effective inductance that the signal will

‘see’ as:

Leff+L1)L2"2M (eq. 1)

where M describes the mutual inductance, which is a coupling factor between the conductors.

The ±M will be ‘+’ for currents going in the same direction and ‘−’ for currents going in the opposite direction. Figure 4 shows the direction of the fields when current is flowing such that the current is flowing into the left conductor and returning on the right conductor in a loop. In this case, the mutual inductance would be subtractive to give an overall lower effective inductance of the current path.

We can use mutual inductance to our benefit to reduce the overall effective inductance of the current path. We do this by bringing the return path of the current as close as possible to the source current. Conversely, if currents are going in the same direction, this would increase the effective inductance.

In this case, one would want to utilize techniques to minimize the interaction between signals.

We now have a description for a “current loop”. A current loop describes the path the current takes from the source and back to its origin (see Figure 5). The goal is to make the current loop as small as possible.

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Figure 5. Current Loop Return Path Current Path

Large Loop Area

Load

If one gets a lower effective inductance when the current return path is as close to the signal wire as possible, then using a power/ground plane under the signal wire can reduce the loop area. Also, for signals going in the same direction, the effective inductance would be higher, so one would want to separate them by a distance, if possible. Therefore, one must think about the current loop area and keeping that as small as possible in the layout. Designs with small loop areas have lower EMI.

Currents will follow the path of least impedance.

Resistive effects dominate at low frequencies. L and C effects dominate at high frequencies.

Thermal Considerations

Module layout can have a major impact on the noise levels of the final product because of the elevation of the module temperature. It is imperative to integrate proper thermal management strategies in the system design to prevent degradation of image quality.

Module Layout Best Practices

The following sections provide design guidelines and considerations regarding various areas of the layout:

General Guidelines

Clocks and High-Speed Traces

Power Supply

Power Supply Decoupling and Bypassing

General Capacitor Guidelines

Decoupling Capacitor Recommendations General Guidelines

The following list provides design guidelines and considerations regarding various areas of the layout. We realize that most designs cannot conform to all of these rules because of size and other constraints. The information in the list is presented such that the layout designer can think about the tradeoffs during the design process.

Follow ON Semiconductor data sheet and developer guide for information to correctly terminate unused pins.

To lower inductance and minimize crosstalk, use multilayer boards with a solid power and ground plane.

If a solid plane is not possible, consider minimizing the

All high-frequency signals should flow over a solid ground plane related to the signal to minimize the current return loop.

When using flex cables, use a return path under the signal traces where possible.

For external connections, place all the connectors that will go to the same destination board close to each other to avoid large current return loop.

Use ground plane under traces to minimize crosstalk (for example, on flex between sensor and connector, a thin lamination under traces is better than a thick one).

Route signal traces over their respective power/ground return paths. This means digital areas over digital ground, and analog portions over analog ground.

Differential traces should be adjacent and matched physically.

Use VIAs carefully. VIAs represent discontinuity in the signal path.

Use additional ground pads to isolate signals and to allow for short return paths.

Separate digital and analog grounds.

One must also keep in mind the design trade-off between electrical and thermal requirements. Design rules to optimize signal integrity can often negatively affect thermal performance of the system. Verify that there is a sufficient thermal path to reduce the die operating temperature that would otherwise affect image quality.

Clocks and High-Speed Traces

Widen spacing between HS signal lines as routing restrictions allow extra space, especially on the clock inputs.

Keep high speed (that is, fast tr, tf) signals away from the clock lines.

Shield the clock with grounded adjacent traces.

Keep clock traces as straight and short as possible.

Discontinuities on a transmission path will degrade a signal. Do not use sharp 90-degree bends. Mitered 45-degree bends are preferred.

Keep clock signals on a single layer.

Turn on slew rate control, if available, to slow down fast edges when speed is not critical to minimize simultaneous pad switching currents and ground bounce and minimize over- and undershoot due to pulse reflections from the load.

If necessary, use proper terminations to reduce potential reflections and ringing on fast signals.

Limit high frequency signals as much as possible.

Avoid VIAs, which can cause impedance changes and reflections.

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Power Supply

Use solid plane layers to distribute power.

Shared power distributions can increase crosstalk between physical areas. For more information about crosstalk, see Inductance, Mutual Inductance, and Mutual Capacitance.

Make traces related to power and ground as short and wide as possible to reduce the potential for supply sag and ground bounce effects.

Consider trace inductance and mutual coupling when designing power distribution.

Pair respective power supply lines and areas.

Position for a low inductance power and ground trace.

Space power and ground pads to allow for required bypass capacitors.

Maintain as much plane structure and connectivity as possible. Try not to tear up the ground planes with too many holes and cuts.

Minimize the spacing between planes to increase coupling and create built in capacitance.

Do not share VIAs.

Provide sufficient power and ground connections.

Connect each ground pad or VIA to the ground and power planes individually. Avoid daisy-chaining connections.

Bond wires typically add 1 nH/mil for 1 mil gold wire.

Bond wires can be responsible for a significant amount of parasitic effects. For example, a 1 mil diameter gold wire can typically add 1 nH/mil of self inductance.

Power Supply Decoupling and Bypassing

Bypassing is used for reducing the high frequency current flow by shunting and reducing the noise current to ground.

Proper bypassing is required for decoupling. The bypassing path must provide significantly lower impedance at the frequency of interest than the power supply leads.

The goal of decoupling is to prevent the transmission of noise from one part of the circuit to another by providing isolation between the two circuits to ensure proper operation.

Decoupling and bypassing typically involve using capacitors tied to ground, or other trace signals to reduce noise levels.

General Capacitor Guidelines

The minimum decoupling capacitor must be able to supply the current required during worst-case switching conditions. Use C(dV) = di/dt to calculate the required capacitor sizes.

In a real system with parasitic effects, the circuit will consist of multiple RLC components.

Use surface mount low effective series resistance (ESR) capacitors to minimize lead inductance over a high range of frequencies.

Multiple capacitors on a supply makes it easier for physical distribution by lowering effective inductance and ESR. However, if one uses multiple capacitors, be aware that a frequency resonant pole can be created between the values used.

Mount the capacitor as close as possible to the sensor power and ground pads.

Place the smaller, high frequency capacitors nearer to the sensor pads to provide a shorter path for fast transient currents.

Use large, multiple VIAs from the capacitors to the power planes to minimize R and L while allowing for maximum current flow.

Use wide, short traces between VIAs and capacitor pads, or adjacent to the pad.

A real world capacitor is not just a bulk capacitor, but can be modeled as a RLC in series. Be aware of the frequency characteristics of the components used.

Verify that the temperature characteristics of the capacitors used will be suitable for the system operating environment. The characteristics of the capacitors can be significantly degraded at higher temperatures.

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Current Recommendations

1. This typical configuration shows only one scenario out of multiple possible variations for this sensor. The minimum recommended decoupling configuration is 0.1mF per supply on module and 10mF off module.

2. If a MIPI interface is not required, the following pads must be left floating: DOUT_P, DOUT_N, CLK_P, and CLK_N.

3. The VGPIO pads can serve multiple features that can be reconfigured. The function and direction will vary by applications. If VGPIO pads are not required, the VDD_VGPIO, GND_VGPIO, and VGPIO[7:0] pads can be left floating.

4. Only one of the output modes (serial or parallel) can be used at any time.

5. ON Semiconductor recommends a resistor value of 1.5 kW to VDD_IO for the two-wire serial interface RPull-up; however, greater values may be used for slower transmission speeds.

6. VAA and VAA_PIX must be tied together.

7. VPP is the one-time programmable (OTP) memory programming voltage and should be left floating during normal operation.

8. VDDIO_TX can be connected to VDD_IO if VDD_IO = 2.8 V. Otherwise, VDDIO_TX can be tied to the VAA supply if an ON Semiconductor recommended decoupling capacitor is used. VDDIO_TX must be connected to a 2.8 V supply.

9. If STANDBY and SHUTDOWN pins are not used, they must be connected to DGND. Figure 6. Typical Connection for the MT9P111 I/O

Power

AGND SCLK

SDATA VDD_IO

VDD_IO

Notes:

PIXCLK

VDD VAA/VAA_PIX DGND

VGPIO[7:0]3 EXTCLK RESET_BAR SADDR

Analog Power

VAA_PIX6

LINE_VALID FRAME_VALID DOUT[7:0]

CLK_N CLK_P

To Parallel Camera Port

To Serial Camera Port OR4 RPULL-Up5

Multi-Master Two-wire Serial Interface

Active LOW Reset

External Clock In (10−48 MHz)

General Purpose Inputs

STANDBY9 Standby Mode

TEST_EN

VAA6

DOUT_N DOUT_P PLL

Power

VDD

Digital Core Power

VDD_PLL MIPI

TX Power

VDDIO_TX8

VPP7

To VCM Actuator VCM_OUT

GNDIO_VCM

GND_IO GND_VGPIO3 GNDIO_TX

ATEST1 ATEST0 SHUTDOWN9 Standby Mode

S_SDATA S_SCL Slave

Two-wire Serial

Interface 3V_VGPIODD

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Decoupling Capacitor Recommendations

It is important to provide clean, well-regulated power to each power supply. The customer is ultimately responsible for ensuring that clean power is provided for their own designs because hardware design is influenced by many factors, including layout, operating conditions, and component selection.

The recommendations for capacitor placement and values listed below are based on the ON Semiconductor internal demo camera design and verified in hardware.

ON Semiconductor recommends the following, in order of preference:

1. Mount 0.1mF and 1mF decoupling capacitors for each power supply as close as possible to the pad and place a 10mF capacitor nearby off-module.

2. If module limitations allow for only six decoupling capacitors for a three-regulator design (VDD_PLL tied to VAA), use a 0.1mF and 1mF capacitor for each of the three regulated supplies.

ON Semiconductor also recommends placing a 10mF capacitor for each supply off-module, but close to each supply.

3. If module limitations allow for only three decoupling capacitors, use a 1mF capacitor (preferred) or a 0.1mF capacitor for each of the three regulated supplies. ON Semiconductor also recommends placing a 10mF capacitor for each supply off-module but close to each supply.

4. Give priority to the VAA supply for additional decoupling capacitors.

ON Semiconductor does not recommend inductive filtering components.

Summary

We have presented some general module layout guidelines for our customers to consider and have touched upon a few of the concepts of signal integrity to help familiarize our customers with the basis of those rules.

Schematic and layout reviews are available for ON Semiconductor customers. Contact your ON Semiconductor representative for information regarding customer schematic and layout reviews.

Additional Resources

See TN−09−49 Connecting Bypass Capacitors to MT9M112 for more information.

ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.

ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.

ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.

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