CALL FOR PAPERS
W W R R T T L L T T ’ ’ 0 0 9 9
General Chair
Krishnendu Chakrabarty Duke University
Program Co-Chair(s)
Qiang Xu
The Chinese University of Hong Kong
Yinhe Han
Institute of Computing Technology, CAS
Panel Chair
Yu Huang Mentor Graphics
Publicity Chair
Lei Zhang
Institute of Computing Technology, CAS
Publication Chair
Wei Wang
HeFei University of Technology, China
Finance Chair
Yubin Zhang
The Chinese University of Hong Kong
Registration Chair
Xiao Liu
The Chinese University of Hong Kong
Local Arrangement Chair
Feng Yuan
The Chinese University of Hong Kong
Ex Officio
Kazumi Hatayama STARC, Japan
Steering Committee
Chair: Xiaowei Li, China Vice-Chair: Tomoo Inoue, Japan Members:
Hideo Fujiwara, Japan Terumine Hayashi, Japan Kazuhiko Iwasaki, Japan Erik Larsson, Sweden Alex Orailoglu, USA Kewal K. Saluja, USA
Further Information Email: wrtlt09@cse.cuhk.edu.hk
Sponsored by
IEEE Computer Society Test Technology Technical Council IEICE-ISS, Technical Committee on Dependable Computing
In cooperation with
Institute of Computing Technology, CAS The Chinese University of Hong Kong
Scope
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.
WRTLT'09, the tenth workshop, will be held in Hong Kong SAR, China. We expect this workshop to provide an ideal forum for frank discussion on this important topic for the future system-on-a-chip (SoC) devices.
Areas of interest include but are not limited to:
- Functional fault modeling - RTL ATPG - Microprocessor testing - RTL BIST - Relationship between RTL and gate level testing - Design verification - High level test bench generation - SoC testing - High level approaches for testing - RTL DFT Submissions
Authors are invited to submit paper proposals for presentation at the workshop. The proposal may be an extended summary (1,000 words) or a full paper and should include: title, full name and affiliation of all authors, 50 words abstract, keywords and the name of contact author. All submissions should be sent to the following address as Postscript or PDF attachment.
wrtlt09@cse.cuhk.edu.hk
The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript in time for inclusion in the digests and will present the paper at the Workshop.
Key Dates Submission deadline: August 4, 2009
Notification of acceptance: September 11, 2009 Camera-ready copy: October 10, 2009 Workshop:
November 27-28, 2009
The Tenth IEEE Workshop on RTL and High Level Testing
November 27-28, the Chinese University of Hong Kong, Hong Kong SAR, ChinaJing-Jia Liou Srinivas Patil Tsuyoshi Shinogi Virendra Singh
Mohammad Tehranipoor Baosheng Wang
Xiaoqing Wen Program Committee
Bhargab Bhattacharya Jinian Bian
Masaki Hashizume Terumine Hayashi Toshinori Hosokawa Yu Hu
Yu Huang
Michiko Inoue Tomoo Inoue Seiji Kajihara Erik Larsson Chien-Mo Li Huawei Li Huaguo Liang
Dong Xiang Tomokazu Yoneda Zhiqiang You Danella Zhao
